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74LVT16244BEV Datasheet(PDF) 10 Page - NXP Semiconductors |
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74LVT16244BEV Datasheet(HTML) 10 Page - NXP Semiconductors |
10 / 16 page 74LVT_LVTH16244B_5 © Koninklijke Philips Electronics N.V. 2006. All rights reserved. Product data sheet Rev. 05 — 21 March 2006 10 of 16 Philips Semiconductors 74LVT16244B; 74LVTH16244B 3.3 V 16-bit buffer/driver; 3-state Test data is given in Table 10. Definitions test circuit: RL = Load resistor. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to output impedance Zo of the pulse generator. VEXT = Test voltage for switching times. Fig 7. Load circuitry for switching times Table 10. Test data Input Load VEXT VI fi tW tr, tf CL RL tPHZ, tPZH tPLZ, tPZL tPLH, tPHL 2.7 V ≤ 10 MHz 500 ns ≤ 2.5 ns 50 pF 500 Ω GND 6 V open VEXT VCC VI VO 001aae235 DUT CL RT RL RL PULSE GENERATOR VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf |
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