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ADC12L030 Datasheet(PDF) 9 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
No. de pieza ADC12L030
Descripción Electrónicos  3.3V Self-Calibrating 12-Bit Plus Sign Serial I/O A/D Converters with MUX and Sample/Hold
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Fabricante Electrónico  NSC [National Semiconductor (TI)]
Página de inicio  http://www.national.com
Logo NSC - National Semiconductor (TI)

ADC12L030 Datasheet(HTML) 9 Page - National Semiconductor (TI)

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AC Electrical Characteristics (Continued)
Note 16: Channel leakage current is measured after the channel selection.
Note 17: Timing specifications are tested at the TTL logic levels, VIL = 0.4V for a falling edge and VIH = 2.4V for a rising edge. TRI-STATE output voltage is forced
to 1.4V.
Note 18: The ADC12L030 family’s self-calibration technique ensures linearity and offset errors as specified, but noise inherent in the self-calibration process will
result in a maximum repeatability uncertainty of 0.2 LSB.
Note 19: If SCLK and CCLK are driven from the same clock source, then tA is 6, 10, 18 or 34 clock periods minimum and maximum.
Note 20: The “12-Bit Conversion of Offset” and “12-Bit Conversion of Full-Scale” modes are intended to test the functionality of the device. Therefore, the output
data from these modes are not an indication of the accuracy of a conversion result.
01183007
FIGURE 1. Transfer Characteristic
01183008
FIGURE 2. Simplified Error Curve vs. Output Code without Auto-Calibration or Auto-Zero Cycles
www.national.com
9


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