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CLP200M Datasheet(PDF) 8 Page - STMicroelectronics

No. de Pieza. CLP200M
Descripción  OVERVOLTAGE AND OVERCURRENT PROTECTION FOR TELECOM LINE
Descarga  21 Pages
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Fabricante  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
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CLP200M Datasheet(HTML) 8 Page - STMicroelectronics

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Fig. 10 : Transversal and longitudinal test
topologies.
Fig. 12 : Power contact test circuit.
Fig. 11 : Power induction test circuit.
Aor B
Bor A
E
15
25
0.2
µF
50
20
µF
4kv
ITEM
UNDER
TEST
A
B
E
15
25
0.2
µF
50
20
µF
ITEM
UNDER
TEST
25
4kv
TRANSVERSAL TEST
LONGITUDINAL TEST
A
B
R1
ITEM
UNDER
TEST
R2
1
µF
1
µF
E
S2
S1
100
A
B
<10
ITEM
UNDER
TEST
<10
E
600
600
3. CLP200M TESTS RESULTS ACCORDING TO
CCITT K20 RECOMMENDATIONS
3.1 CCITT K20 Recommendations
In respect with the CCITT recommendations, the
CLP200M has to withstand three kinds of distur-
bances.
3.1.1. Lightning simulation
(Test 2, table 2/K20)
This test shall be done in transversaland longitudi-
nal modes as shown in figure 10.
The test generator is the 10/700
µs with 4kV of
peak voltage.
3.1.2. Power induction
(Test 3a and 3b, table 2/K20)
Two kinds of tests using the same circuit topology
(see fig.11) are defined in the CCITT K20.
Test 3a :
Vac(max) = 300VRMS, R1 = R2 = 600
S2 operating and test duration = 200 ms.
Test 3b :
Vac(max) = 300VRMS (*), R1 = R2 = 200
S2 operating and test duration not defined.
(*) Recommended value.
3.1.3. Power contact (Test 3, table 1/K20)
This test shall be done with the test circuit of figure
12.
Vac(max) = 220VRMS , with switch S in each posi-
tion and duration 15 min.
3.1.4. Acceptance criteria and number of tests
For the tests described in chapter3.1.1., 3.1.2. and
3.1.3. two criteria are defined :
A: Equipment shall withstand the test without dam-
age and shall operate properly within the specified
limits.
B: A fire hazard should not occur in the equipment
as a result of the tests.
The criteria are affected to the different tests as
mentioned in the table 1.
®
CLP200M
8/21


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