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HCF4021B Datasheet(PDF) 6 Page - STMicroelectronics |
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HCF4021B Datasheet(HTML) 6 Page - STMicroelectronics |
6 / 13 page DYNAMIC ELECTRICAL CHARACTERISTICS (Continued) Symbol Parameter Test Conditions Value Unit VDD (V) Min. Typ. Max. CLOCKED OPERATION tr,tf Clock Input Rise or Fall Time 5 15 µs 10 15 15 15 tsetup Setup Time, serial Input (ref. to CL) 5 120 60 ns 10 80 40 15 60 30 tsetup Setup Time, parallel Input (4014B) (ref. to CL) 580 40 ns 10 50 25 15 40 20 tsetup Setup Time, parallel Input (4021B) (ref. to P/S) 550 25 ns 10 30 15 15 20 10 tsetup Setup Time, parallel/serial Control (4014B) (ref. to CL) 5 180 90 ns 10 80 40 15 60 30 thold Hold Time, serial in, parallel in, parallel/serial Cotrol 50 ns 10 0 15 0 tWH P/S Pulse Width (4021B) 5 160 80 ns 10 80 40 15 50 25 trem P/S Removal time (4021B) (ref. to CL) 5 280 140 ns 10 140 70 15 100 50 Typical Output Low (sink) Current Characteristics. Minimum Output Low (sink) Current Charac- teristics. * If more than one unit is cascaded trCL should be made less than or equal to the sum of the transition time and the fixed propagation delay of the output of the driving stage of the estimated capacitive load. HCC/HCF4014B/4021B 6/13 |
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