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LM60BIM3 Datasheet(PDF) 3 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor. Click here to check the latest version.
No. de pieza LM60BIM3
Descripción Electrónicos  2.7V, SOT-23 or TO-92 Temperature Sensor
Download  11 Pages
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Fabricante Electrónico  NSC [National Semiconductor (TI)]
Página de inicio  http://www.national.com
Logo NSC - National Semiconductor (TI)

LM60BIM3 Datasheet(HTML) 3 Page - National Semiconductor (TI)

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Absolute Maximum Ratings (Note 1)
Supply Voltage
+12V to −0.2V
Output Voltage
(+V
S + 0.6V)
to −0.6V
Output Current
10 mA
Input Current at any pin (Note 2)
5 mA
ESD Susceptibility (Note 3) :
Human Body Model
2500V
Machine Model
SOT-23
TO-92
250V
200V
Storage Temperature
−65˚C to
+150˚C
Maximum Junction Temperature (T
JMAX)
+125˚C
Operating Ratings(Note 1)
Specified Temperature Range:
T
MIN
≤ T
A
≤ T
MAX
LM60B
−25˚C
≤ T
A
≤ +125˚C
LM60C
−40˚C
≤ T
A
≤ +125˚C
Supply Voltage Range (+V
S)
+2.7V to +10V
Thermal Resistance,
θ
JA (Note
5)
SOT-23
TO-92
450˚C/W
180˚C/W
Soldering process must comply with National Semiconduc-
tor’s Reflow Temperature Profile specifications. Refer to
www.national.com/packaging. (Note 4)
Electrical Characteristics
Unless otherwise noted, these specifications apply for +V
S = +3.0 VDC and I LOAD = 1 µA. Boldface limits apply for TA =TJ =
T
MIN to TMAX ; all other limits TA =TJ = 25˚C.
Parameter
Conditions
Typical
(Note 6)
LM60B
LM60C
Units
(Limit)
Limits
Limits
(Note 7)
(Note 7)
Accuracy (Note 8)
±2.0
±3.0
˚C (max)
±3.0
±4.0
˚C (max)
Output Voltage at 0˚C
+424
mV
Nonlinearity (Note 9)
±0.6
±0.8
˚C (max)
Sensor Gain
+6.25
+6.06
+6.00
mV/˚C (min)
(Average Slope)
+6.44
+6.50
mV/˚C (max)
Output Impedance
800
800
Ω (max)
Line Regulation (Note 10)
+3.0V
≤ +V
S
≤ +10V
±0.3
±0.3
mV/V (max)
+2.7V
≤ +V
S
≤ +3.3V
±2.3
±2.3
mV (max)
Quiescent Current
+2.7V
≤ +V
S
≤ +10V
82
110
110
µA (max)
125
125
µA (max)
Change of Quiescent Current
+2.7V
≤ +V
S
≤ +10V
±5.0
µA (max)
Temperature Coefficient of
0.2
µA/˚C
Quiescent Current
Long Term Stability (Note 11)
T
J=TMAX=+125˚C, for
±0.2
˚C
1000 hours
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed
specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test
conditions.
Note 2: When the input voltage (VI) at any pin exceeds power supplies (VI < GND or VI > +VS), the current at that pin should be limited to 5 mA.
Note 3: The human body model is a 100 pF capacitor discharged through a 1.5 k
Ω resistor into each pin. The machine model is a 200 pF capacitor discharged
directly into each pin.
Note 4: Reflow temperature profiles are different for lead-free and non-lead-free packages.
Note 5: The junction to ambient thermal resistance (
θJA) is specified without a heat sink in still air.
Note 6: Typicals are at TJ =TA = 25˚C and represent most likely parametric norm.
Note 7: Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 8: Accuracy is defined as the error between the output voltage and +6.25 mV/˚C times the device’s case temperature plus 424 mV, at specified conditions of
voltage, current, and temperature (expressed in ˚C).
Note 9: Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device’s rated temperature
range.
Note 10: Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be
computed by multiplying the internal dissipation by the thermal resistance.
Note 11: For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature cycled for at least 46
hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered; allow time for stress relaxation to occur. The
majority of the drift will occur in the first 1000 hours at elevated temperatures. The drift after 1000 hours will not continue at the first 1000 hour rate.
www.national.com
3


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