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ADS5545 Datasheet(PDF) 7 Page - Texas Instruments

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No. de pieza ADS5545
Descripción Electrónicos  11-BIT, 200 MSPS ADC
Download  54 Pages
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Fabricante Electrónico  TI [Texas Instruments]
Página de inicio  http://www.ti.com
Logo TI - Texas Instruments

ADS5545 Datasheet(HTML) 7 Page - Texas Instruments

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DIGITAL CHARACTERISTICS
(1)
TIMING CHARACTERISTICS – LVDS AND CMOS MODES
(1)
ADS5517
SLWS203 – DECEMBER 2007
The DC specifications refer to the condition where the digital outputs are not switching, but are permanently at a valid logic
level 0 or 1 AVDD = DRVDD = 3.3 V, IO = 3.5 mA, RL = 100 Ω
(2)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
DIGITAL INPUTS
High-level input voltage
2.4
V
Low-level input voltage
0.8
V
High-level input current
33
µA
Low-level input current
–33
µA
Input capacitance
4
pF
DIGITAL OUTPUTS – CMOS MODE
High-level output voltage
3.3
V
Low-level output voltage
0
V
Output capacitance
Output capacitance inside the device, from each output to
2
pF
ground
DIGITAL OUTPUTS – LVDS MODE
High-level output voltage
1375
mV
Low-level output voltage
1025
mV
Output differential voltage, |VOD|
225
350
425
mV
VOS Output offset voltage, single-ended
Common-mode voltage of OUTP and OUTM
1200
mV
Output capacitance inside the device, from either output to
Output capacitance
2
pF
ground
(1)
All LVDS and CMOS specifications are characterized, but not tested at production.
(2)
IO refers to the LVDS buffer current setting, RL is the differential load resistance between the LVDS output pair.
Typical values are at 25
°C, min and max values are across the full temperature range T
MIN = –40°C to TMAX = 85°C, AVDD =
DRVDD = 3.3 V, sampling frequency = 200 MSPS, sine wave input clock, 1.5 VPP clock amplitude, CL = 5 pF
(2), I
O = 3.5 mA,
RL = 100 Ω
(3), no internal termination, unless otherwise noted.
For timings at lower sampling frequencies, see the Output Timing section in the APPLICATION INFORMATION of this data
sheet.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
ta
Aperture delay
1.2
ns
tj
Aperture jitter
150
fs rms
Time to valid data after coming out of
100
STANDBY mode
Wake-up time
µs
Time to valid data after stopping and
100
restarting the input clock
clock
Latency
14
cycles
DDR LVDS MODE(4)
tsu
Data setup time(5)
Data valid (6) to zero-cross of CLKOUTP
1.0
1.5
ns
Zero-cross of CLKOUTP to data becoming
th
Data hold time(5)
0.35
0.8
ns
invalid(6)
(1)
Timing parameters are specified by design and characterization and not tested in production.
(2)
CL is the effective external single-ended load capacitance between each output pin and ground.
(3)
IO refers to the LVDS buffer current setting; RL is the differential load resistance between the LVDS output pair.
(4)
Measurements are done with a transmission line of 100
Ω characteristic impedance between the device and the load.
(5)
Setup and hold time specifications take into account the effect of jitter on the output data and clock. These specifications also assume
that the data and clock paths are perfectly matched within the receiver. Any mismatch in these paths within the receiver would appear
as reduced timing margin.
(6)
Data valid refers to logic high of +50 mV and logic low of –50 mV.
Copyright © 2007, Texas Instruments Incorporated
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