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SMP100LC-XXX Datasheet(PDF) 5 Page - STMicroelectronics

No. de Pieza. SMP100LC-XXX
Descripción  TRISILTM FOR HIGH DEBIT RATE TELECOM LINES PROTECTION
Descarga  8 Pages
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Fabricante  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
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SMP100LC-XXX Datasheet(HTML) 5 Page - STMicroelectronics

   
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FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT 1 : GO-NO GO TEST
R
-VP
V
BAT = - 48 V
Surge generator
D.U.T.
This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit.
TEST PROCEDURE :
- Adjust the current level at the IH value by short circuiting the D.U.T.
- Fire the D.U.T. with a surge current : Ipp = 10A, 10/1000
µs.
- The D.U.T. will come back to the off-state within 50 ms max.
1
2
5
10
20
50
100
200
0.0
0.5
1.0
1.5
2.0
2.5
VR(V)
C [VR] / C [VR=50V]
Fig 5 : Variation of junction capacitance versus re-
verse voltage applied (typical values).


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