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SN74BCT640NE4 Datasheet(PDF) 1 Page - Texas Instruments

No. de pieza SN74BCT640NE4
Descripción Electrónicos  OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
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Fabricante Electrónico  TI [Texas Instruments]
Página de inicio  http://www.ti.com
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SN74BCT640NE4 Datasheet(HTML) 1 Page - Texas Instruments

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SN54BCT640, SN74BCT640
OCTAL BUS TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCBS025C – SEPTEMBER 1988 – REVISED APRIL 1994
Copyright
© 1994, Texas Instruments Incorporated
2–1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
State-of-the-Art BiCMOS Design
Substantially Reduces Standby Current
Outputs Have Undershoot-Protection
Circuitry
Power-Up High-Impedance State
Buffered Control Inputs to Reduce DC
Loading Effects
ESD Protection Exceeds 2000 V
Per MIL-STD-883C, Method 3015
Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK) and Flatpacks (W), and
Plastic and Ceramic 300-mil DIPs (J, N)
description
The
′BCT640 bus transceiver is designed for
asynchronous
communication
between
data
buses. These devices transmit data from the A
bus to the B bus or from the B bus to the A bus
depending upon the level at the direction-control
(DIR) input. The output-enable (OE) input can be
used to disable the device so that the buses are
effectively isolated.
The SN54BCT640 is characterized for operation
over the full military temperature range of – 55
°C
to 125
°C. The SN74BCT640 is characterized for
operation from 0
°C to 70°C.
FUNCTION TABLE
INPUTS
OPERATION
OE
DIR
OPERATION
L
L
B data to A bus
L
HA data to B bus
H
X
Isolation
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
DIR
A1
A2
A3
A4
A5
A6
A7
A8
GND
VCC
OE
B1
B2
B3
B4
B5
B6
B7
B8
SN54BCT640 ...J OR W PACKAGE
SN74BCT640 . . . DW OR N PACKAGE
(TOP VIEW)
32
1 20 19
9 10 11 12 13
4
5
6
7
8
18
17
16
15
14
B1
B2
B3
B4
B5
A3
A4
A5
A6
A7
SN54BCT640 . . . FK PACKAGE
(TOP VIEW)
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.


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