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ADS6149IRGZT Datasheet(PDF) 10 Page - Texas Instruments

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No. de pieza ADS6149IRGZT
Descripción Electrónicos  14/12-Bit, 250/210 MSPS ADCs With DDR LVDS and Parallel CMOS Outputs
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Fabricante Electrónico  TI [Texas Instruments]
Página de inicio  http://www.ti.com
Logo TI - Texas Instruments

ADS6149IRGZT Datasheet(HTML) 10 Page - Texas Instruments

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TIMING REQUIREMENTS – LVDS AND CMOS MODES
(1)
ADS6149/ADS6129
ADS6148/ADS6128
SLWS211B – JULY 2008 – REVISED OCTOBER 2008 ..................................................................................................................................................... www.ti.com
Typical values are at 25°C, AVDD = 3.3V, DRVDD = 1.8V, sampling frequency = 250 MSPS, sine wave input clock,
CLOAD = 5pF
(2), R
LOAD = 100Ω
(3), LOW SPEED mode disabled, unless otherwise noted.
Min and max values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD = 3.3V, DRVDD = 1.7V to
1.9V.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
The delay in time between the rising edge of the input sampling clock and
ta
Aperture delay
0.7
1.2
1.7
ns
the actual time at which the sampling occurs
tj
Aperture jitter
170
fs rms
Time to valid data after coming out of STANDBY mode
0.3
1
µs
Time to valid data after coming out of PDN GLOBAL mode
25
100
Wake-up time
clock
Time to valid data after stopping and restarting the input clock
10
cycles
clock
ADC Latency(4)
Default, after reset
18
cycles
DDR LVDS MODE (5)
tsu
Data setup time
Data valid (6) to zero-crossing of CLKOUTP
0.8
1.2
ns
th
Data hold time
Zero-crossing of CLKOUT to data becoming invalid(6)
0.25
0.6
ns
tPDI
Clock propagation delay
Input clock rising edge cross-over to output clock rising edge cross-over
0.2 × ts + tdelay
ns
100 MSPS
≤ Sampling frequency ≤ 250 MSPS
tdelay
5.0
6.2
7.5
ns
Duty cycle of differential clock, (CLKOUTP–CLKOUTM)
LVDS bit clock duty cycle
52%
100 MSPS
≤ Sampling frequency ≤ 250 MSPS
Rise time measured from –100 mV to 100 mV
tRISE,
Data rise time,
Fall time measured from 100 mV to –100 mV
0.08
0.14
0.2
ns
tFALL
Data fall time
1 MSPS
≤ Sampling frequency ≤ 250 MSPS
Rise time measured from –100 mV to 100 mV
tCLKRISE,
Output clock rise time,
Fall time measured from 100 mV to –100 mV
0.08
0.14
0.2
ns
tCLKFALL
Output clock fall time
1 MSPS
≤ Sampling frequency ≤ 250 MSPS
tOE
Output enable (OE) to data delay
Time to valid data after OE becomes active
40
ns
PARALLEL CMOS MODE(7)
tSTART
Input clock to data delay
Input clock rising edge cross-over to start of data valid(8)
3.2
ns
tDV
Data valid time
Time interval of valid data(8)
0.7
1.5
ns
tPDI
Clock propagation delay
Input clock rising edge cross-over to output clock rising edge cross-over
0.78 × ts + tdelay
100 MSPS
≤ Sampling frequency ≤ 150 MSPS
tdelay
5
6.5
8
ns
Duty cycle of differential clock, (CLKOUT)
Output clock duty cycle
50%
100 MSPS
≤ Sampling frequency ≤ 150 MSPS
tRISE,
Data rise time,
Rise time measured from 20% to 80% of DRVDD,
Fall time measured from 80% to 20% of DRVDD,
0.7
1.2
2
ns
tFALL
Data fall time
1 MSPS
≤ Sampling frequency ≤ 250 MSPS
Rise time measured from 20% to 80% of DRVDD,
tCLKRISE,
Output clock rise time,
Fall time measured from 80% to 20% of DRVDD,
0.5
1
1.5
ns
tCLKFALL
Output clock fall time
1 MSPS
≤ Sampling frequency ≤ 150 MSPS
tOE
Output enable (OE) to data delay
Time to valid data after OE becomes active
20
ns
(1)
Timing parameters are specified by design and characterization and not tested in production.
(2)
CLOAD is the effective external single-ended load capacitance between each output pin and ground
(3)
RLOAD is the differential load resistance between the LVDS output pair.
(4)
At higher frequencies, tPDI is greater than one clock period and overall latency = ADC latency + 1.
(5)
Measurements are done with a transmission line of 100
Ω characteristic impedance between the device and the load. Setup and hold
time specifications take into account the effect of jitter on the output data and clock.
(6)
Data valid refers to LOGIC HIGH of +100mV and LOGIC LOW of –100mV.
(7)
For Fs> 150 MSPS, it is recommended to use external clock for data capture and NOT the device output clock signal (CLKOUT).
(8)
Data valid refers to LOGIC HIGH of 1.26V and LOGIC LOW of 0.54V.
10
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Product Folder Link(s): ADS6149/ADS6129 ADS6148/ADS6128


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