Motor de Búsqueda de Datasheet de Componentes Electrónicos
  Spanish  ▼
ALLDATASHEET.ES

X  

SN74BCT8374ADWRE4 Datasheet(PDF) 1 Page - Texas Instruments

No. de pieza SN74BCT8374ADWRE4
Descripción Electrónicos  SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
Download  26 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Fabricante Electrónico  TI [Texas Instruments]
Página de inicio  http://www.ti.com
Logo TI - Texas Instruments

SN74BCT8374ADWRE4 Datasheet(HTML) 1 Page - Texas Instruments

  SN74BCT8374ADWRE4 Datasheet HTML 1Page - Texas Instruments SN74BCT8374ADWRE4 Datasheet HTML 2Page - Texas Instruments SN74BCT8374ADWRE4 Datasheet HTML 3Page - Texas Instruments SN74BCT8374ADWRE4 Datasheet HTML 4Page - Texas Instruments SN74BCT8374ADWRE4 Datasheet HTML 5Page - Texas Instruments SN74BCT8374ADWRE4 Datasheet HTML 6Page - Texas Instruments SN74BCT8374ADWRE4 Datasheet HTML 7Page - Texas Instruments SN74BCT8374ADWRE4 Datasheet HTML 8Page - Texas Instruments SN74BCT8374ADWRE4 Datasheet HTML 9Page - Texas Instruments Next Button
Zoom Inzoom in Zoom Outzoom out
 1 / 26 page
background image
SN54BCT8374A, SN74BCT8374A
SCAN TEST DEVICES
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS045E – JUNE 1990 – REVISED JULY 1996
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
D Members of the Texas Instruments
SCOPE
™ Family of Testability Products
D Octal Test-Integrated Circuits
D Functionally Equivalent to ’F374 and
’BCT374 in the Normal-Function Mode
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
D Test Operation Synchronous to Test
Access Port (TAP)
D Implement Optional Test Reset Signal by
Recognizing a Double-High-Level Voltage
(10 V ) on TMS Pin
D SCOPE ™ Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/ Toggle Outputs
D Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic
(NT) and Ceramic (JT) 300-mil DIPs
description
The ’BCT8374A scan test devices with octal
edge-triggered D-type flip-flops are members of
the
Texas
Instruments
SCOPE
™ testability
integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary
scan to facilitate testing of complex circuit-board
assemblies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) interface.
In the normal mode, these devices are functionally equivalent to the ’F374 and ’BCT374 octal D-type flip-flops.
The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device
terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect
the functional operation of the SCOPE
™ octal flip-flops.
In the test mode, the normal operation of the SCOPE
™ octal flip-flops is inhibited and the test circuitry is enabled
to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform
boundary-scan test operations as described in IEEE Standard 1149.1-1990.
Copyright
© 1996, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
CLK
1Q
2Q
3Q
4Q
GND
5Q
6Q
7Q
8Q
TDO
TMS
OE
1D
2D
3D
4D
5D
VCC
6D
7D
8D
TDI
TCK
SN54BCT8374A ...JT PACKAGE
SN74BCT8374A . . . DW OR NT PACKAGE
(TOP VIEW)
32 1 28 27
12 13
5
6
7
8
9
10
11
25
24
23
22
21
20
19
8D
TDI
TCK
NC
TMS
TDO
8Q
2D
1D
OE
NC
CLK
1Q
2Q
426
14 15 16 17 18
SN54BCT8374A . . . FK PACKAGE
(TOP VIEW)
NC – No internal connection
SCOPE is a trademark of Texas Instruments Incorporated.
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.


Número de pieza similar - SN74BCT8374ADWRE4

Fabricante ElectrónicoNo. de piezaDatasheetDescripción Electrónicos
logo
Texas Instruments
SN74BCT8374ADWRE4 TI-SN74BCT8374ADWRE4 Datasheet
644Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
More results

Descripción similar - SN74BCT8374ADWRE4

Fabricante ElectrónicoNo. de piezaDatasheetDescripción Electrónicos
logo
Texas Instruments
SN54BCT8374A TI-SN54BCT8374A_08 Datasheet
644Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN54F374 TI1-SN54F374_16 Datasheet
1Mb / 20P
[Old version datasheet]   OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS
logo
Unisonic Technologies
U74AHC374 UTC-U74AHC374_15 Datasheet
271Kb / 6P
   OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS
U74HCT374 UTC-U74HCT374_15 Datasheet
233Kb / 6P
   OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS
logo
Texas Instruments
SN54AC374 TI-SN54AC374_07 Datasheet
684Kb / 18P
[Old version datasheet]   OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN74HC534N TI1-SN74HC534N Datasheet
235Kb / 10P
[Old version datasheet]   OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS
logo
Unisonic Technologies
U74AHC574 UTC-U74AHC574_15 Datasheet
240Kb / 7P
   OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS
logo
Texas Instruments
SN54ALS374A TI1-SN54ALS374A_16 Datasheet
1Mb / 23P
[Old version datasheet]   OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN54HC574 TI1-SN54HC574_16 Datasheet
1Mb / 23P
[Old version datasheet]   OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS
logo
Unisonic Technologies
U74AHCT374 UTC-U74AHCT374_15 Datasheet
233Kb / 6P
   OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS
More results


Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26


Datasheet Descarga

Go To PDF Page


Enlace URL




Política de Privacidad
ALLDATASHEET.ES
¿ALLDATASHEET es útil para Ud.?  [ DONATE ] 

Todo acerca de Alldatasheet   |   Publicidad   |   Contáctenos   |   Política de Privacidad   |   Intercambio de Enlaces   |   Lista de Fabricantes
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com