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CAT5113VI-01-G Datasheet(PDF) 3 Page - ON Semiconductor

No. de pieza CAT5113VI-01-G
Descripción Electrónicos  100-Tap Digitally Programmable Potentiometer
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Fabricante Electrónico  ONSEMI [ON Semiconductor]
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CAT5113VI-01-G Datasheet(HTML) 3 Page - ON Semiconductor

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CAT5113
© 2008 SCILLC. All rights reserved.
3
Doc. No. MD-2009 Rev. X
Characteristics subject to change without notice
OPERATION MODES
INC
¯¯¯
CS
¯¯
U/D
¯
Operation
High to Low
Low
High
Wiper toward H
High to Low
Low
Low
Wiper toward L
High
Low to High
X
Store Wiper Position
Low
Low to High
X
No Store, Return to Standby
X
High
X
Standby
ABSOLUTE MAXIMUM RATINGS
(1)
Parameters
Ratings
Units
Supply Voltage
VCC to GND
-0.5 to +7V
V
Inputs
CS
¯¯ to GND
-0.5 to VCC +0.5
V
INC
¯¯¯ to GND
-0.5 to VCC +0.5
V
U/D
¯ to GND
-0.5 to VCC +0.5
V
H to GND
-0.5 to VCC +0.5
V
L to GND
-0.5 to VCC +0.5
V
W to GND
-0.5 to VCC +0.5
V
Parameters
Ratings
Units
Operating Ambient Temperature
Commercial (‘C’ or Blank suffix)
0 to 70
ºC
Industrial (‘I’ suffix)
-40 to +85
ºC
Junction Temperature
+150
ºC
Storage Temperature
-65 to 150
ºC
Lead Soldering (10s max)
+300
ºC
RELIABILITY CHARACTERISTICS
Symbol
Parameter
Test Method
Min
Typ
Max
Units
VZAP
(2)
ESD Susceptibility
MIL-STD-883, Test Method 3015
2000
V
ILTH
(2) (3)
Latch-Up
JEDEC Standard 17
100
mA
TDR
Data Retention
MIL-STD-883, Test Method 1008
100
Years
NEND
Endurance
MIL-STD-883, Test Method 1003
1,000,000
Stores
DC ELECTRICAL CHARACTERISTICS
VCC = +2.5V to +6V unless otherwise specified
Power Supply
Symbol
Parameter
Conditions
Min
Typ
Max
Units
VCC
Operating Voltage Range
2.5
6.0
V
VCC = 6V, f = 1MHz, IW = 0
100
µA
ICC1
Supply Current (Increment)
VCC = 6V, f = 250kHz, IW = 0
50
µA
Programming, VCC = 6V
1000
µA
ICC2
Supply Current (Write)
VCC = 3V
500
µA
ISB1
(3)
Supply Current (Standby)
CS
¯¯ = VCC - 0.3V
U/D
¯, INC
¯¯¯ = VCC - 0.3V or GND
0.01
1
µA
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) This parameter is tested initially and after a design or process change that affects the parameter.
(3) Latch-up protection is provided for stresses up to 100mA on address and data pins from -1V to VCC + 1V
(4) IW = source or sink
(5) These parameters are periodically sampled and are not 100% tested.


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