CAT5221WI-25 datasheet(4/16 Pages) ONSEMI

No. de pieza	CAT5221WI-25

Descripción Electrónicos	Dual Digitally Programmable Potentiometer with 64 Taps and I2C Interface

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Fabricante Electrónico	ONSEMI [ON Semiconductor]

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CAT5221

Doc. No. MD-2113 Rev. L

4

Characteristics subject to change without notice

D.C. OPERATING CHARACTERISTICS

Over recommended operating conditions unless otherwise stated.

Symbol Parameter

Test Conditions

Min

Typ

Max

Units

ICC

Power Supply Current

fSCL = 400kHz

1

mA

ISB

Standby Current (VCC = 5.0V)

VIN = GND or VCC; SDA Open

1

µA

ILI

Input Leakage Current

VIN = GND to VCC

10

µA

ILO

Output Leakage Current

VOUT = GND to VCC

10

µA

VIL

Input Low Voltage

-1

VCC x 0.3

V

VIH

Input High Voltage

VCC x 0.7

VCC + 1.0

V

VOL1

Output Low Voltage (VCC = 3.0V)

IOL = 3 mA

0.4

V

CAPACITANCE

TA = 25°C, f = 1.0MHz, VCC = 5V

Symbol

Parameter

Test Conditions

Min

Typ

Max

Units

CI/O

(1)

Input/Output Capacitance (SDA)

VI/O = 0V

8

pF

CIN

(1)

Input Capacitance (A0, A1, A2, A3, SCL)

VIN = 0V

6

pF

A.C. CHARACTERISTICS

Over recommended operating conditions unless otherwise stated.

Symbol

Parameter

Min

Typ

Max

Units

fSCL

Clock Frequency

400

kHz

TI

(1)

Noise Suppression Time Constant at SCL, SDA Inputs

50

ns

tAA

SLC Low to SDA Data Out and ACK Out

0.9

µs

tBUF

(1)

Time the Bus Must Be Free Before a New Transmission Can Start

1.2

µs

tHD:STA

Start Condition Hold Time

0.6

µs

tLOW

Clock Low Period

1.2

µs

tHIGH

Clock High Period

0.6

µs

tSU:STA

Start Condition Setup Time (For a Repeated Start Condition)

0.6

µs

tHD:DAT

Data in Hold Time

0

ns

tSU:DAT

Data in Setup Time

100

ns

tR

(1)

SDA and SCL Rise Time

0.3

µs

tF

(1)

SDA and SCL Fall Time

300

ns

tSU:STO

Stop Condition Setup Time

0.6

µs

tDH

Data Out Hold Time

50

ns

POWER UP TIMING

(1)

Over recommended operating conditions unless otherwise stated.

Symbol

Parameter

Min

Typ

Max

Units

tPUR

Power-up to Read Operation

1

ms

tPUW

Power-up to Write Operation

1

ms

Note:

(1) This parameter is tested initially and after a design or process change that affects the parameter.

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