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SN74F377A Datasheet(PDF) 2 Page - Texas Instruments |
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SN74F377A Datasheet(HTML) 2 Page - Texas Instruments |
2 / 5 page SN74F377A OCTAL D-TYPE FLIP-FLOP WITH CLOCK ENABLE SDFS018D – D2932, MARCH 1987 – REVISED OCTOBER 1993 2–2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 logic symbol† 13 5D 14 6D 17 7D 18 8D 1Q 2 2Q 5 3Q 6 4Q 9 1C2 CE G1 1 11 CLK 2D 3 1D 4 2D 7 3D 8 4D 5Q 12 6Q 15 7Q 16 8Q 19 † This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. logic diagram (positive logic) 1D 11 1Q 1D C1 CLK CE 1 3 2 To Seven Other Channels absolute maximum ratings over operating free-air temperature range (unless otherwise noted)‡ Supply voltage range, VCC – 0.5 V to 7 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input voltage range, VI (see Note 1) – 1.2 V to 7 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input current range – 30 mA to 5 mA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Voltage range applied to any output in the high state – 0.5 V to VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Current into any output in the low state 40 mA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Operating free-air temperature range 0 °C to 70°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Storage temperature range – 65 °C to 150°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ‡ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTE 1: The input-voltage ratings may be exceeded provided the input-current ratings are observed. |
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