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LA126B-3-SR Datasheet(PDF) 5 Page - LIGITEK electronics co., ltd. |
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LA126B-3-SR Datasheet(HTML) 5 Page - LIGITEK electronics co., ltd. |
5 / 5 page LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 1.T.Sol=230 ℃±5℃ 2.Dwell time=5 ±1sec Solderability Test This test intended to see soldering well performed or not. MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 MIL-STD-883:1008 JIS C 7021: B-10 MIL-STD-202:103B JIS C 7021: B-11 MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 JIS C 7021: B-12 MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 The purpose of this is the resistance of the device which is laid under ondition of hogh temperature for hours. High Temperature Storage Test 1.Ta=105 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) 1.Ta=-40 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) 1.Ta=105 ℃±5℃&-40℃±5℃ (10min) (10min) 2.total 10 cycles 1.Ta=65 ℃±5℃ 2.RH=90 %~95 % 3.t=240hrs ±2hrs 1.T.Sol=260 ℃±5℃ 2.Dwell time= 10 ±1sec. Thermal Shock Test Solder Resistance Test High Temperature High Humidity Test Low Temperature Storage Test The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. The purpose of this test is the resistance of the device under tropical for hous. The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. Test Condition 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) Reliability Test: Test Item Operating Life Test This test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. Description Reference Standard Page 4/4 PART NO. LA126B-3/SR |
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