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DAC5670I Datasheet(PDF) 6 Page - Texas Instruments |
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DAC5670I Datasheet(HTML) 6 Page - Texas Instruments |
6 / 29 page DAC5670 SGLS394 – MARCH 2010 www.ti.com TERMINAL DESCRIPTION NAME NO. A1, A6, A8, A9, A11, A16, B6, B11, C6, C7, C8, C9, C10, C11, C14, E1, E2, E3, E5, E12, F3, F4, F6, F7, F10, F11, G1, G2, G3, G4, G6, G7, G8, GND Ground G9, G10, G11, H1, H7,H10, H16, J1, J7, J10, J16, K6, K7, K8, K9, K10, K11, L6, L7, L10, L11, M5, M12, P3, P14, T1, T8, T9, T16 B3, B8, B9, C1, E6, E7, E8, E9, E10, E11, F5, F8, F9, F12, G5, G12, H5, H6, H11, H12, H14, J5, J6, AVDD 3.3 V Analog power supply J11, J12, K5, K12, L5, L8, L9, L12, M6, M7, M8, M9, M10, M11, R8, R9 A3, A4, A13, A15, B1, B4, B13, B15, C4, C12, C13, C15, D3, D8, D9, D10, D11, D12, D13, D14, D15, E4, E13, E14, E15, F13, F14, F15, F16, No internal connection. These balls can be connected to GND (if No connect G13, G14, G15, G16, H2, H3, H4, H13, J4, J13, desired), or left open. K3, K4, K13, L14, M14, N5, N6, N7, N10, N11, N12, N13, N14, P1, P4, P5, P6, P7,P11, P12, R2, R5, T10, T11, T15 No connect D1 Factory use only, must be left unconnected. Absolute Maximum Ratings (1) over operating free-air temperature range (unless otherwise noted) MIN MAX UNIT Supply voltage AVDD to GND 5.0 V DA_P[13..0], DA_N[13..0], Measured with respect to GND -0.3 AVDD + 0.3 V DB_P[13..0], DB_N[13..0] NORMAL, A_ONLY, Measured with respect to GND -0.3 AVDD + 0.3 V A_ONLY_INV, A_ONLY_ZS DTCLK_P, DTCLK_N, Measured with respect to GND -0.3 AVDD + 0.3 V DACCLK_P, DACCLK_N LVDS_HTB, INV_CLK, Measured with respect to GND -0.3 AVDD + 0.3 V RESTART IOUT_P, IOUT_N Measured with respect to GND AVDD – 0.5 AVDD + 1.5 V CSCAP_IN, REFIO_IN, Measured with respect to GND -0.3 AVDD + 0.3 V RBIAS_IN Peak input current (any input) 20 mA Storage temperature range –65 150 °C Maximum Junction Temperature 150 °C Lead temperature 1,6 mm (1/16 in) from the case for 10 s 260 °C (1) Stresses above those listed under "absolute maximum ratings" may cause permanent damage to the device. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 6 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): DAC5670 |
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