74F827 datasheet(8/13 Pages) NXP

No. de pieza	74F827

Descripción Electrónicos	10-bit buffer/line driver; non-inverting; 3-state

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Fabricante Electrónico	NXP [NXP Semiconductors]

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8 / 13 page

74F827_4

Product data sheet

Rev. 04 — 29 January 2010

8 of 13

NXP Semiconductors

74F827

10-bit buffer/line driver; non-inverting; 3-state

a. Input pulse deﬁnition

b. Test circuit

Test data and VEXT levels are given in Table 8.

RL = Load resistance.

CL = Load capacitance including jig and probe capacitance.

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

VEXT = Test voltage for switching times.

Fig 7.

Test circuit for measuring switching times

001aac221

VM

tW

10 %

90 %

0 V

VI

negative

pulse

positive

pulse

0 V

VM

90 %

10 %

tf

tr

tf

VEXT

VCC

VI

VO

mna616

DUT

CL

RT

RL

G

Table 8.

Test data

Input

Load

VEXT

VI

fI

tW

tr, tf

CL

RL

tPHL, tPLH

tPZH, tPHZ

tPZL, tPLZ

3.0 V

1 MHz

500 ns

≤ 2.5 ns

50 pF

500

Ω

open

7.0 V

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