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ADS1247 Datasheet(PDF) 3 Page - Texas Instruments

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No. de pieza ADS1247
Descripción Electrónicos  24-Bit Analog-to-Digital Converters for Temperature Sensors
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ADS1246
ADS1247
ADS1248
www.ti.com
SBAS426D – AUGUST 2008 – REVISED MARCH 2010
THERMAL INFORMATION
ADS1246,
ADS1247,
ADS1248
THERMAL METRIC(1)
UNITS
TSSOP (IPW)
28
qJA
Junction-to-ambient thermal resistance(2)
54.6
qJC(top)
Junction-to-case(top) thermal resistance (3)
11.3
qJB
Junction-to-board thermal resistance (4)
13.0
°C/W
yJT
Junction-to-top characterization parameter (5)
0.5
yJB
Junction-to-board characterization parameter (6)
12.7
qJC(bottom)
Junction-to-case(bottom) thermal resistance (7)
n/a
(1)
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
(2)
The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, High-K board, as
specified in JESD51-7, in an environment described in JESD51-2a.
(3)
The junction-to-case(top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC-standard
test exists, but a close description can be found in the ANSI SEMI standard G30-88.
(4)
The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB
temperature, as described in JESD51-8.
(5)
The junction-to-top characterization parameter, yJT, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining qJA, using a procedure described in JESD51-2a (sections 6 and 7).
(6)
The junction-to-board characterization parameter, yJB estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining qJA , using a procedure described in JESD51-2a (sections 6 and 7).
(7)
The junction-to-case(bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific
JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
Copyright © 2008–2010, Texas Instruments Incorporated
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