CAT64LC40

http://onsemi.com

2

SK

DI

DO

1

2

3

4

8

7

6

5

SK

1

2

3

4

8

7

6

5

SK

1

2

3

4

8

7

6

5

1

2

3

4

8

7

6

5

SK

DI

DO

PIN CONNECTIONS

PDIP−8 (P, L)

SOIC−8 (J, W)

SOIC−8 (S, V)

TSSOP−8 (U, Y)

CS

RDY/BUSY

RESET

GND

RDY/BUSY

CS

RESET

GND

DO

DI

DO

DI

CS

RDY/BUSY

RESET

GND

CS

RDY/BUSY

RESET

GND

Table 1. ABSOLUTE MAXIMUM RATINGS

Parameters

Ratings

Unit

Temperature Under Bias

−55 to +125

°C

Storage Temperature

−65 to +150

°C

Voltage on any Pin with Respect to Ground (Note 1)

V

−2.0 to +7.0

V

1.0

W

Lead Soldering Temperature (10 secs)

300

°C

Output Short Circuit Current (Note 2)

100

mA

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

1. The minimum DC input voltage is −0.5 V. During transitions, inputs may undershoot to −2.0 V for periods of less than 20 ns. Maximum DC

2. Output shorted for no more than one second. No more than one output shorted at a time.

Table 2. RELIABILITY CHARACTERISTICS

Symbol

Parameter

Min

Max

Units

Endurance

1,000,000

Cycles/Byte

Data Retention

100

Years

ESD Susceptibility

2000

V

Latch−Up

100

mA

3. This parameter is tested initially and after a design or process change that affects the parameter.

Symbol

Test

Conditions

Max

Units

Input/Output Capacitance (DO, RDY/BSY)

8

pF

Input Capacitance (CS, SK, DI, RESET)

6

pF

5. This parameter is tested initially and after a design or process change that affects the parameter.