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74AHC30D Datasheet(PDF) 8 Page - NXP Semiconductors

No. de Pieza. 74AHC30D
Descripción  8-input NAND gate
Descarga  14 Pages
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Fabricante  NXP [NXP Semiconductors]
Página de inicio  http://www.nxp.com
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74AHC30D Datasheet(HTML) 8 Page - NXP Semiconductors

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74AHC_AHCT30_3
© NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 03 — 26 June 2009
8 of 14
NXP Semiconductors
74AHC30; 74AHCT30
8-input NAND gate
Test data is given in Table 9.
Definitions for test circuit:
RT = termination resistance should be equal to the output impedance Zo of the pulse generator.
CL = load capacitance including jig and probe capacitance.
Fig 7.
Load circuitry for measuring switching times
001aah768
tW
tW
tr
tr
tf
VM
VI
negative
pulse
GND
VI
positive
pulse
GND
10 %
90 %
90 %
10 %
VM
VM
VM
tf
VCC
DUT
RT
VI
VO
CL
G
Table 9.
Test data
Type
Input
Load
Test
VI
tr, tf
CL
74AHC30
VCC
≤ 3.0 ns
15 pF, 50 pF
tPLH, tPHL
74AHCT30
3.0 V
≤ 3.0 ns
15 pF, 50 pF
tPLH, tPHL


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