TPS740xx

SBVS091A

– JUNE 2011 – REVISED JUNE 2011

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PRODUCT

(2)

TPS740xx yyy z

YYY is package designator.

Z is package quantity.

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the

device product folder at www.ti.com.

(2)

Fixed output voltages of 1.2 V is available; minimum order quantities may apply. Contact factory for details and availability.

(3)

For fixed 0.9-V operation, tie FB to OUT.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range (unless otherwise noted).

VALUE

MIN

MAX

UNIT

IN, BIAS

–0.3

+6.0

V

Voltage

EN, FB, OUT

–0.3

(2)

V

Current

OUT

Internally limited

A

Human body model (HBM, JESD22-A114A)

2

kV

Charged device model (CDM, JESD22-C101B.01)

500

V

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to

absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

(3)

ESD testing is performed according to the respective JESD22 JEDEC standard.

2

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© 2011, Texas Instruments Incorporated

Product Folder Link(s): TPS740xx