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ADUM1100ARWZ Datasheet(PDF) 2 Page - Analog Devices

No. de pieza ADUM1100ARWZ
Descripción Electrónicos  ESD/Latch-Up Considerations with iCoupler짰 Isolation Products
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Table I summarizes the ESD test results for the
ADuM140x quad isolator. One might conclude from
Table I that
iCouplers can only be used in systems with
ESD ratings of < 4 kV. In reality it is quite common for
iCouplers to be used in systems that pass 15 kV ESD
levels per IEC 61000-4-2.
The difference is in the test methods:
The component-level tests call for direct application
of ESD events to the pins or body of an unpowered
device, while system-level tests call for application ESD
events to various locations in the system accessible to
external ESD occurrences. Furthermore, the specific
waveforms used in component-level and system-level
testing differ.
Table I. ADuM140x ESD Test Results
ESD
First Pass
First Fail
Model
Voltage (V)
Voltage (V)
Human
Body Model
3,500
4,000
Field Induced Charge
Device Model
1,500
2,000
Machine Model
200
400
For complete information on Analog Devices ESD testing, refer to the
Analog Devices Reliability Handbook.
To accurately predict the performance of
iCouplers in
a system, the designer needs to understand the nature
of the system tests and weigh how they impact the
iCoupler at the component level. Table II lists common
system-level tests used in
iCoupler applications. Several
examples of these tests will be discussed later.
Table II. Common System Tests Used
in
iCoupler Applications
Test
Test
Standard
Purpose
Voltage (V rms)1
IEC 61000-4-2
ESD
2,000 to 15,000
IEC 61000-4-4
FastTransient/Burst
500 to 4,000
IEC 61000-4-5
Surge
500 to 4,000
1IEC 61000-4 tests include compliance levels; the test voltages shown
are the ranges for level 1 (lowest) through level 4 (highest) compliance.
iCoupler Model for Analyzing SystemTest Performance
Figure 2 shows a circuit model of an
iCoupler which is
useful to understand the impact of system-level testing.
Inductors L1, L2, L3, and L4 are due largely to package
pins and bond wires, while capacitor C1 is due to the
stray capacitance across the isolation barrier. The induc-
tance values are approximately 0.2 nH. The capacitance
value is approximately 0.3 pF per
iCoupler channel.
L1
VDD1
VIN
GND1
VDD2
VO
GND2
L3
C1
L2
L4
Figure 2.
iCoupler Model Useful in Analyzing
System Designs
Latch-Up in CMOS Devices
Inherent in a CMOS process are parasitic PNP and
NPN transistors configured as silicon control rectifiers
(SCR). Latch-up is a condition that comes about when
this parasitic SCR is triggered. This causes a low resis-
tance to appear from VDD to ground, and a subsequent
large current to be drawn through the device. This
excessive current lays open the possibility of damage
due to EOS.
Damage caused by latch-up can range from complete
destruction of the device to parametric degradation. More
insidious are latent failures that could affect operation
later in a system’s lifetime. An excellent treatise on
the subject of latch-up in general can be found in the
Analog Dialogue 35- 05 (2001) article, “Winning the
Battle Against Latch-Up in CMOS Switches.” While
this article specifically addresses problems with CMOS
switches, it is generally applicable to all CMOS devices,
including
iCouplers.
The use of ceramic bypass capacitors to minimize supply
noise between VDD and ground is highly recommended
in all
iCoupler applications. These should have a value
between 0.01 F and 0.1 F and be placed as close as
possible to the
iCoupler device. Even with adequate
bypassing, latch-up problems may still occur in some
applications. Placing a 200  resistor in series with VDD is
also helpful. This limits the supply current to 25 mA in 5 V
applications, which is below the latch-up trigger current.
However, depending on the supply current being drawn,
this series resistance can reduce the supply voltage at
the
iCoupler to an unacceptable level. This is most likely
to be a concern when operating at high data rates that
involve high supply currents.
Usually the mechanism that causes latch-up is an over-
voltage condition beyond the part’s absolute maximum
rating (>7.0 V or <–0.5 V for most
iCoupler products).
Once an
iCoupler is integrated into a system the source
of the overvoltage is not always clear. However, it is
usually manageable once understood.
REV. 0
REV. 0


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