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ADG783BCP Datasheet(PDF) 2 Page - Analog Devices |
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ADG783BCP Datasheet(HTML) 2 Page - Analog Devices |
2 / 8 page REV. A –2– ADG781/ADG782/ADG783–SPECIFICATIONS (VDD = 5 V 10%, GND = 0 V. All specifications –40 C to +85 C unless otherwise noted.) B Version –40 C to Parameter +25 C +85 C Unit Test Conditions/Comments ANALOG SWITCH Analog Signal Range 0 V to VDD V On Resistance (RON) 2.5 Ω typ VS = 0 V to VDD, IS = –10 mA; 4 4.5 Ω max Test Circuit 1 On-Resistance Match Between 0.05 Ω typ VS = 0 V to VDD, IS = –10 mA Channels ( ∆RON) 0.4 Ω max On-Resistance Flatness (RFLAT(ON)) 0.5 Ω typ VS = 0 V to VDD, IS = –10 mA 1.0 Ω max LEAKAGE CURRENTS VDD = 5.5 V; Source OFF Leakage IS (OFF) ±0.01 nA typ VS = 4.5 V/1 V, VD = 1 V/4.5 V; ±0.1 ±0.2 nA max Test Circuit 2 Drain OFF Leakage ID (OFF) ±0.01 nA typ VS = 4.5 V/1 V, VD = 1 V/4.5 V; ±0.1 ±0.2 nA max Test Circuit 2 Channel ON Leakage ID, IS (ON) ±0.01 nA typ VS = VD = 1 V, or 4.5 V; ±0.1 ±0.2 nA max Test Circuit 3 DIGITAL INPUTS Input High Voltage, VINH 2.4 V min Input Low Voltage, VINL 0.8 V max Input Current IINL or IINH 0.005 µA typ VIN = VINL or VINH ±0.1 µA max DYNAMIC CHARACTERISTICS2 tON 11 ns typ RL = 300 Ω, CL = 35 pF, 16 ns max VS = 3 V; Test Circuit 4 tOFF 6 ns typ RL = 300 Ω, C L = 35 pF, 10 ns max VS = 3 V; Test Circuit 4 Break-Before-Make Time Delay, tD 6 ns typ RL = 300 Ω, CL = 35 pF, (ADG783 Only) 1 ns min VS1 = VS2 = 3 V; Test Circuit 5 Charge Injection 3 pC typ VS = 2 V; RS = 0 Ω, CL = 1 nF; Test Circuit 6 Off Isolation –58 dB typ RL = 50 Ω, C L = 5 pF, f = 10 MHz –78 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; Test Circuit 7 Channel-to-Channel Crosstalk –90 dB typ RL = 50 Ω, C L = 5 pF, f = 10 MHz; Test Circuit 8 Bandwidth –3 dB 200 MHz typ RL = 50 Ω, CL = 5 pF; Test Circuit 9 CS (OFF) 10 pF typ f = 1 MHz CD (OFF) 10 pF typ f = 1 MHz CD, CS (ON) 22 pF typ f = 1 MHz POWER REQUIREMENTS VDD = 5.5 V IDD 0.001 µA typ Digital Inputs = 0 V or 5.5 V 1.0 µA max NOTES 1Temperature ranges are as follows: B Version: –40 °C to +85°C. 2Guaranteed by design, not subject to production test. Specifications subject to change without notice. |
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