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ADM213E Datasheet(PDF) 11 Page - Analog Devices |
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ADM213E Datasheet(HTML) 11 Page - Analog Devices |
11 / 16 page ADM206E/ADM207E/ADM208E/ADM211E/ADM213E REV. B –11– R1 R2 C1 DEVICE UNDER TEST HIGH VOLTAGE GENERATOR ESD TEST METHOD R2 C1 H. BODY MIL-STD883B 1.5k 100pF IEC1000-4-2 330 150pF Figure 25. ESD Test Standards 100 90 36.8 10 tDL tRL TIME t Figure 26. Human Body Model ESD Current Waveform 100 90 10 TIME t 30ns 60ns 0.1 TO 1ns Figure 27. IEC1000-4-2 ESD Current Waveform The ADM2xxE family of products are tested using both the above mentioned test methods. All pins are tested with respect to all other pins as per the MIL-STD-883B specification. In addition all I-O pins are tested as per the IEC test specification. The products were tested under the following conditions: (a) Power-On—Normal Operation (b) Power-On—Shutdown Mode (c) Power-Off There are four levels of compliance defined by IEC1000-4-2. The ADM2xxE family of products meet the most stringent compliance level for both contact and for air-gap discharge. This means that the products are able to withstand contact discharges in excess of 8 kV and air-gap discharges in excess of 15 kV. Table IV. IEC1000-4-2 Compliance Levels Contact Discharge Air Discharge Level kV kV 12 2 24 4 36 8 48 15 Table V. ADM2xxE ESD Test Results ESD Test Method I-O Pins Other Pins MIL-STD-883B ±15 kV ±2.5 kV IEC1000-4-2 Contact ±8 kV Air ±15 kV FAST TRANSIENT BURST TESTING (IEC1000-4-4) IEC1000-4-4 (previously 801-4) covers electrical fast-transient/ burst (EFT) immunity. Electrical fast transients occur as a result of arcing contacts in switches and relays. The tests simu- late the interference generated when for example a power relay disconnects an inductive load. A spark is generated due to the well known back EMF effect. In fact the spark consists of a burst of sparks as the relay contacts separate. The voltage appear- ing on the line, therefore, consists of a bust of extremely fast tran- sient impulses. A similar effect occurs when switching on fluorescent lights. The fast transient burst test defined in IEC1000-4-4 simulates this arcing and its waveform is illustrated in Figure 28. It con- sists of a burst of 2.5 kHz to 5 kHz transients repeating at 300 ms intervals. It is specified for both power and data lines. 300ms 15ms t V 5ns 0.2/0.4ms 50ns V t Figure 28. IEC1000-4-4 Fast Transient Waveform |
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