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ACT-SF41632 Datasheet(PDF) 4 Page - Aeroflex Circuit Technology

No. de pieza ACT-SF41632
Descripción Electrónicos  ACT-SF41632 High Speed 128Kx32 SRAM / 512Kx32 Flash Multichip Module
Download  11 Pages
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Fabricante Electrónico  AEROFLEX [Aeroflex Circuit Technology]
Página de inicio  http://www.aeroflex.com
Logo AEROFLEX - Aeroflex Circuit Technology

ACT-SF41632 Datasheet(HTML) 4 Page - Aeroflex Circuit Technology

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Aeroflex Circuit Technology
SCD3851 REV A 5/21/98
Plainview NY (516) 694-6700
4
Timing Diagrams — SRAM
DI/O
tRC
tOH
tAA
Data Valid
Previous Data Valid
tOE
High Z
tOHZ
Read Cycle Timing Diagrams
Data Valid
tCLZ
SCE
OE
tACE
tCHZ
UNDEFINED
DON’T CARE
Read Cycle 2 (SWE = VIH)
Write Cycle (SCE Controlled, OE = VIH )
tCW
tAS
tWP
tDW
tOW
SCE
SWE
Data Valid
Write Cycle (SWE Controlled, OE = VIH)
DI/O
AC Test Circuit
IOL
Parameter
Typical
Units
Input Pulse Level
0 – 3.0
V
Input Rise and Fall
5
ns
Input and Output Timing Reference Level
1.5
V
Notes:
1) VZ is programmable from -2V to +7V. 2) IOL and IOH programmable from 0 to 16 mA. 3) Tester Impedance
ZO = 75
Ω. 4) VZ is typically the midpoint of VOH and VOL. 5) IOL and IOH are adjusted to simulate a typical resistance
load circuit. 6) ATE Tester includes jig capacitance.
IOH
To Device Under Test
VZ ~ 1.5 V (Bipolar Supply)
Current Source
Current Source
CL = 50 pF
tWC
tAW
tAH
tRC
tAA
tOLZ
SEE NOTE
SEE NOTE
SEE NOTE
SEE NOTE
Note: Guaranteed by design, but not tested.
DI/O
tDH
tWHZ
SEE NOTE
Read Cycle 1 (SCE = OE = VIL, SWE = VIH)
Write Cycle Timing Diagrams
tWP
tDW
Data Valid
tWC
tAW
tAH
DI/O
tDH
SCE
SWE
tCW
tAS
A0-18
A0-18
A0-18
A0-18
AC Test Conditions


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