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BDP1A16G Datasheet(PDF) 9 Page - Agere Systems

No. de pieza BDP1A16G
Descripción Electrónicos  Quad Differential Drivers BDG1A, BDP1A, BDGLA, BPNGA, BPNPA, and BPPGA
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Lucent Technologies Inc.
9
Data Sheet
January 1999
BDG1A, BDP1A, BDGLA, BPNGA, BPNPA, and BPPGA
Quad Differential Drivers
ESD Failure Models
Lucent employs two models for ESD events that can
cause device damage or failure.
1.
A human-body model (HBM) that is used by most
of the industry for ESD-susceptibility testing and
protection-design evaluation. ESD voltage thresh-
olds are dependent on the critical parameters used
to define the model. A standard HBM (resistance =
1500
Ω, capacitance = 100 pF) is widely used and,
therefore, can be used for comparison purposes.
2.
A charged-device model (CDM), which many
believe is the better simulator of electronics manu-
facturing exposure.
Tables 5 and 6 illustrate the role these two models play
in the overall prevention of ESD damage. HBM ESD
testing is intended to simulate an ESD event from a
charged person. The CDM ESD testing simulates
charging and discharging events that occur in produc-
tion equipment and processes, e.g., an integrated cir-
cuit sliding down a shipping tube.
The HBM ESD threshold voltage presented here was
obtained by using these circuit parameters.
Table 5. Typical ESD Thresholds for Data
Transmission Drivers
Table 6. ESD Damage Protection
Device
HBM
Threshold
CDM
Threshold
BDG1A, BDGLA
>2500
>1000
BDP1A
>2500
>2000
BPPGA, BPNGA,
BPNPA
>3000
>2000
ESD Threat Controls
Personnel
Processes
Control
Wrist straps
ESD shoes
Antistatic flooring
Static-dissipative
materials
Air ionization
Model
Human-body model
(HBM)
Charged-device
model (CDM)
Latch-Up
Latch-up evaluation has been performed on the data transmission drivers. Latch-up testing determines if power-
supply current exceeds the specified maximum due to the application of a stress to the device under test. A device
is considered susceptible to latch-up if the power supply current exceeds the maximum level and remains at that
level after the stress is removed.
Lucent performs latch-up testing per an internal test method that is consistent with JEDEC Standard No. 17 (previ-
ously JC-40.2) “CMOS Latch-Up Standardized Test Procedure.”
Latch-up evaluation involves three separate stresses to evaluate latch-up susceptibility levels:
1. dc current stressing of input and output pins.
2. Power supply slew rate.
3. Power supply overvoltage.
Table 7. Latch-Up Test Criteria and Test Results
Based on the results in Table 6, the data transmission drivers pass the Lucent latch-up testing requirements and
are considered not susceptible to latch-up.
dc Current Stress of
I/O Pins
Power Supply
Slew Rate
Power Supply
Overvoltage
Data Transmission
Driver ICs
Minimum Criteria
≥150 mA
≤1 µs
≥1.75 × Vmax
Test Results
≥250 mA
≤100 ns
≥2.25 × Vmax


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