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AMC1200BDUBR Datasheet(PDF) 2 Page - Texas Instruments |
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AMC1200BDUBR Datasheet(HTML) 2 Page - Texas Instruments |
2 / 24 page AMC1200 AMC1200B SBAS542B – APRIL 2011 – REVISED AUGUST 2012 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE/ORDERING INFORMATION For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the device product folder on www.ti.com. ABSOLUTE MAXIMUM RATINGS (1) Over the operating ambient temperature range, unless otherwise noted. AMC1200, AMC1200B UNIT Supply voltage, VDD1 to GND1 or VDD2 to GND2 –0.5 to 6 V Analog input voltage at VINP, VINN GND1 – 0.5 to VDD1 + 0.5 V Input current to any pin except supply pins ±10 mA Maximum junction temperature, TJ Max +150 °C Human body model (HBM) JEDEC standard 22, test method ±2500 V A114-C.01 Electrostatic discharge (ESD) ratings, all pins Charged device model (CDM) JEDEC standard 22, test method ±1000 V C101 (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability. THERMAL INFORMATION AMC1200, AMC1200B THERMAL METRIC(1) UNITS DUB (SOP) 8 PINS θJA Junction-to-ambient thermal resistance 75.1 θJCtop Junction-to-case (top) thermal resistance 61.6 θJB Junction-to-board thermal resistance 39.8 °C/W ψJT Junction-to-top characterization parameter 27.2 ψJB Junction-to-board characterization parameter 39.4 θJCbot Junction-to-case (bottom) thermal resistance N/A (1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. REGULATORY INFORMATION VDE/IEC UL Certified according to IEC 60747-5-2 Recognized under 1577 component recognition program File number: 40016131 File number: E181974 2 Submit Documentation Feedback Copyright © 2011–2012, Texas Instruments Incorporated Product Folder Links: AMC1200 AMC1200B |
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