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DAC7568 Datasheet(PDF) 4 Page - Texas Instruments |
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DAC7568 Datasheet(HTML) 4 Page - Texas Instruments |
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4 / 65 page  DAC7568 DAC8168 DAC8568 SBAS430D – JANUARY 2009 – REVISED MAY 2012 www.ti.com ELECTRICAL CHARACTERISTICS (continued) At AVDD = 2.7V to 5.5V and over –40°C to +125°C (unless otherwise noted). DAC7568/DAC8168/DAC8568 PARAMETER TEST CONDITIONS MIN TYP MAX UNIT AC PERFORMANCE(3) SNR 83 dB TA = +25°C, BW = 20kHz, AVDD = 5V, fOUT = 1kHz, THD –63 dB first 19 harmonics removed for SNR calculation, SFDR 63 dB at 16-bit level SINAD 62 dB DAC output noise density TA = +25°C, at zero-code input, fOUT = 1kHz 90 nV/ √Hz DAC output noise TA = +25°C, at mid-code input, 0.1Hz to 10Hz 2.6 μVPP REFERENCE AVDD = 5.5V 360 μA Internal reference current consumption AVDD = 3.6V 348 μA External VREF = 2.5V (when internal reference is External reference current 80 μA disabled), all eight channels active Grades A/B, AVDD = 2.7V to 5.5V 0 AVDD V VREFIN Reference input range Grades C/D, AVDD = 5.0V to 5.5V 0 AVDD/2 V Reference input impedance 8 k Ω REFERENCE OUTPUT Output voltage TA = +25°C; all grades 2.4975 2.5 2.5025 V Initial accuracy TA = +25°C, all grades –0.1 ±0.004 0.1 % DAC7568/DAC8168/DAC8568(4),grades A/B 5 25 Output voltage temperature drift ppm/°C DAC7568/DAC8168/DAC8568(5), grades C/D 2 5 Output voltage noise f = 0.1Hz to 10Hz 12 μVPP TA = +25°C, f = 1MHz, CL = 0μF 50 Output voltage noise density TA = +25°C, f = 1MHz, CL = 1μF 20 nV/ √Hz (high-frequency noise) TA = +25°C, f = 1MHz, CL = 4μF 16 Load regulation, sourcing(6) TA = +25°C 30 μV/mA Load regulation, sinking(6) TA = +25°C 15 μV/mA Output current load capability(3) ±20 mA Line regulation TA = +25°C 10 μV/V Long-term stability/drift (aging)(6) TA = +25°C, time = 0 to 1900 hours 50 ppm First cycle 100 Thermal hysteresis(6) ppm Additional cycles 25 LOGIC INPUTS(3) Input current ±1 μA VINL Logic input LOW voltage 2.7V ≤ AVDD ≤ 5.5V 0.3 × AVDD V 2.7V ≤ AVDD < 4.5V 0.7 × AVDD V VINH Logic input HIGH voltage 4.5V ≤ AVDD ≤ 5.5V 0.625 × AVDD V Pin capacitance 3 pF (3) Specified by design or characterization; not production tested. (4) Reference is trimmed and tested at room temperature, and is characterized from –40°C to +125°C. (5) Reference is trimmed and tested at two temperatures (+25°C and +105°C), and is characterized from –40°C to +125°C. (6) Explained in more detail in the Application Information section of this data sheet. 4 Submit Documentation Feedback Copyright © 2009–2012, Texas Instruments Incorporated Product Folder Link(s): DAC7568 DAC8168 DAC8568 |
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