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ADM2209EARUZ Datasheet(PDF) 11 Page - Analog Devices |
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ADM2209EARUZ Datasheet(HTML) 11 Page - Analog Devices |
11 / 12 page REV. 0 ADM2209E –11– Testing for immunity involves irradiating the device with an EM field. There are various methods of achieving this, including use of an echoic chamber, stripline cell, TEM cell, GTEM cell. A stripline cell consists of two parallel plates with an electric field developed between them. The device under test is placed within the cell and exposed to the electric field. There are three severity levels having field strengths ranging from 1 V to 10 V/m. Results are classified in a fashion similar to those for IEC1000-4-4. 1. Normal operation. 2. Temporary degradation or loss of function that is self- recoverable when the interfering signal is removed. 3. Temporary degradation or loss of function that requires operator intervention or system reset when the interfering signal is removed. 4. Degradation or loss of function that is not recoverable due to damage. The ADM2209E easily meets Classification 1 at the most strin- gent (Level 3) requirement. In fact, field strengths up to 30 V/m showed no performance degradation and error-free data trans- mission continued even during irradiation. Table VII. Test Severity Levels (IEC1000-4-3) Field Strength Level V/m 11 23 310 EMISSIONS/INTERFERENCE EN55 022, CISPR22 defines the permitted limits of radiated and conducted interference from Information Technology (IT) equipment. The objective of the standard is to minimize the level of emissions, both conducted and radiated. APPLICATIONS INFORMATION In a typical Data Terminal Equipment (DTE) to Data Circuit Terminating Equipment (DCE) 9-lead de facto interface imple- mentation, two data lines (TxD and RxD) and six control lines (RTS, DTR, DSR, CTS and RI) are required. With its six drivers and ten receivers, the ADM2209E offers a single-chip solution for the two RS-232 ports normally supplied as standard in a desktop or notebook personal computer, as shown in Figure 28. The flow-through pinout of the device allows for a very simple PCB layout, and allows a ground plane to be placed beneath the IC, and ground lines to be inserted between the signal lines to minimize crosstalk, without the complication of multilayer PCBs. Note that the two receivers kept active by the standby supply (R5INA and R5INB) should be connected to the Ring In (RI) line, so that the system can be awakened when a peripheral device begins to communicate. FAIL-SAFE RECEIVER OUTPUTS The ADM2209E has fail-safe receiver outputs that assume a high output level if the receiver input is zero or open-circuit. LAPLINK COMPATIBILITY The ADM2209E can operate up to 460 kbps data rate under maximum driver load conditions of CL = 1000 pF and RL = 3 k Ω at minimum power supply voltages. SUPER I/O CHIP DCD DSR RxD RTS TxD CTS DTR RI DCD DSR RxD RTS TxD CTS DTR RI 1 2 3 4 5 6 8 9 DCD DSR RxD RTS TxD CTS DTR RI DCD DSR RxD RTS TxD CTS DTR RI 0.1 F +12V +3V or +5V 9-WAY D CONNECTOR COM2 9-WAY D CONNECTOR COM1 7 1 2 3 4 5 6 8 9 7 R1 T3 R3 R2 T1 T2 R4 R5 T3 R3 R2 T1 T2 R4 R1 R5 ADM2209E 0.1 F 0.1 F 0.1 F Figure 28. Typical Application for a Dual Serial Port |
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