ADG602BRTZ-REEL7 datasheet(3/12 Pages) AD

No. de pieza	ADG602BRTZ-REEL7

Descripción Electrónicos	Low on resistance, 2.5 OHM maximum

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Fabricante Electrónico	AD [Analog Devices]

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ADG601/ADG602

Rev. C | Page 3 of 12

SPECIFICATIONS

DUAL SUPPLY

VDD = 5 V ± 10%, VSS = –5 V ± 10%, GND = 0 V, unless otherwise noted.

Table 2.

B Version1

Parameter

+25°C

−40°C to +85°C

Unit

Test Conditions/Comments

ANALOG SWITCH

Analog Signal Range

VSS to VDD

V

VDD = +4.5 V, VSS = –4.5 V

On Resistance (RON)

2

Ω typ

VS = ±4.5 V, IDS = −10 mA; see Figure 15

2.5

5.5

Ω max

On-Resistance Flatness (RFLAT (ON))

0.35

0.4

Ω typ

VS = ±3.3 V, IDS = −10 mA

0.6

0.65

Ω max

LEAKAGE CURRENTS

VDD = +5.5 V, VSS = −5.5 V

Source Off Leakage, IS (Off )

±0.01

nA typ

VS = +4.5 V/−4.5 V, VD = −4.5 V/+4.5 V; see Figure 16

±0.25

±1

nA max

Drain Off Leakage, ID (Off )

±0.01

nA typ

VS = +4.5 V/−4.5 V, VD = −4.5 V/+4.5 V; see Figure 16

±0.25

±1

nA max

Channel On Leakage, ID, IS (On)

±0.01

nA typ

VS = VD = +4.5 V or −4.5 V; see Figure 17

±0.25

±1

nA max

DIGITAL INPUTS

Input High Voltage, VINH

2.4

V min

Input Low Voltage, VINL

0.8

V max

Input Current, IINL or IINH

0.005

μA typ

VIN = VINL or VINH

±0.1

μA max

Digital Input Capacitance, CIN

2

pF typ

DYNAMIC CHARACTERISTICS2

tON

80

ns typ

RL = 300 Ω, CL = 35 pF

120

155

ns max

VS = 3.3 V; see Figure 18

tOFF

45

ns typ

RL = 300 Ω, CL = 35 pF

75

90

ns max

VS = 3.3 V; see Figure 18

Charge Injection

250

pC typ

VS = 0 V, RS = 0 Ω, CL = 1 nF; see Figure 19

Off Isolation

−60

dB typ

RL = 50 Ω, CL = 5 pF, f = 1 MHz; see Figure 20

Bandwidth −3 dB

180

MHz typ

RL = 50 Ω, CL = 5 pF; see Figure 21

CS (Off )

50

pF typ

f = 1 MHz

CD (Off )

50

pF typ

f = 1 MHz

CD, CS (On)

145

pF typ

f = 1 MHz

POWER REQUIREMENTS

VDD = +5.5 V, VSS = −5.5 V

IDD

0.001

μA typ

Digital inputs = 0 V or 5.5 V

1.0

μA max

ISS

0.001

μA typ

Digital inputs = 0 V or 5.5 V

1.0

μA max

1 Temperature range for B version is −40°C to +85°C.

2 Guaranteed by design, not subject to production test.

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