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ADG729BRUZ Datasheet(PDF) 6 Page - Analog Devices |
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ADG729BRUZ Datasheet(HTML) 6 Page - Analog Devices |
6 / 13 page –6– ADG728/ADG729 ABSOLUTE MAXIMUM RATINGS 1 (TA = 25 °C unless otherwise noted.) VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V Analog, Digital Inputs 2 . . . . . . . . . . –0.3 V to VDD + 0.3 V or 30 mA, Whichever Occurs First Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mA (Pulsed at 1 ms, 10% Duty Cycle max) Continuous Current, Each S . . . . . . . . . . . . . . . . . . . . . 30 mA Continuous Current D, ADG729 . . . . . . . . . . . . . . . . . 80 mA Continuous Current D, ADG728 . . . . . . . . . . . . . . . . 120 mA Operating Temperature Range Industrial (B Version) . . . . . . . . . . . . . . . . –40 °C to +85°C Storage Temperature Range . . . . . . . . . . . . –65 °C to +150°C Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 150 °C CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the ADG728/ADG729 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. TSSOP Package θJA Thermal Impedance . . . . . . . . . . . . . . . . . . . 150.4°C/W θ JC Thermal Impedance . . . . . . . . . . . . . . . . . . . . 27.6 °C/W NOTES 1Stresses above those listed under Absolute Maximum Ratings may cause perma- nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Only one absolute maximum rating may be applied at any one time. 2Overvoltages at IN, S or D will be clamped by internal diodes. Current should be limited to the maximum ratings given. TERMINOLOGY CD, CS (ON) “ON” Switch Capacitance. Measured with refer- ence to ground. CIN Digital Input Capacitance. tON Delay time between the 50% and 90% points of the STOP condition and the switch “ON” condition. tOFF Delay time between the 50% and 90% points of the STOP condition and the switch “OFF” condition. tD “OFF” time measured between the 80% points of both switches when switching from one switch to another. Charge A measure of the glitch impulse transferred from Injection the digital input to the analog output during switching. Off Isolation A measure of unwanted signal coupling through an “OFF” switch. Crosstalk A measure of unwanted signal which is coupled through from one channel to another as a result of parasitic capacitance. Bandwidth The frequency at which the output is attenuated by 3 dBs. On Response The frequency response of the “ON” switch. Insertion The loss due to the ON resistance of the switch. Loss WARNING! ESD SENSITIVE DEVICE VDD Most Positive Power Supply Potential. IDD Positive Supply Current. GND Ground (0 V) Reference. S Source Terminal. May be an input or output. D Drain Terminal. May be an input or output. VD (VS) Analog Voltage on Terminals D, S. RON Ohmic Resistance between D and S. ∆RON On Resistance Match Between any Two Chan- nels, i.e., RONmax – RONmin. RFLAT(ON) Flatness is defined as the difference between the maximum and minimum value of on resistance as measured over the specified analog signal range. IS (OFF) Source Leakage Current with the Switch “OFF.” ID (OFF) Drain Leakage Current with the Switch “OFF.” ID, IS (ON) Channel Leakage Current with the Switch “ON.” VINL Maximum Input Voltage for Logic “0.” VINH Minimum Input Voltage for Logic “1.” IINL (IINH) Input Current of the Digital Input. CS (OFF) “OFF” Switch Source Capacitance. Measured with reference to ground. CD (OFF) “OFF” Switch Drain Capacitance. Measured with reference to ground. REV. C Lead Temperature, Soldering . . . . . As per JEDEC J-STD-020 |
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