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TPS53316 Datasheet(PDF) 2 Page - Texas Instruments |
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TPS53316 Datasheet(HTML) 2 Page - Texas Instruments |
2 / 29 page TPS53316 SLUSAP5 – DECEMBER 2011 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION(1)(2) ORDERABLE OUTPUT TA PACKAGE PINS MINIMUM QUANTITY ECO PLAN DEVICE NUMBER SUPPLY TPS53316RGTR 16 Tape and reel 3000 Plastic QFN Green (RoHS and no –40°C to 85°C (RGT) Pb/Br) TPS53316RGTT 16 Mini reel 250 (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the TI website at www.ti.com. (2) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package ABSOLUTE MAXIMUM RATINGS (1) Over operating free air-temperature range (unless otherwise noted) VALUE UNIT VIN –0.3 to 7 VBST –0.3 to17 Input voltage range VBST(with respect to LL) –0.3 to 7 V EN –0.3 to 7 FB, PS. RF/OC –0.3 to 3.7 DC –1 to 7 SW Pulse < 20ns, E=5μJ ≥ –5 or <10 Output voltage range PGD –0.3 to 7 V COMP, VREG3 –0.3 to 3.7 PGND –0.3 to 0.3 Operating free-air temperature, TA –40 to 85 °C Storage temperature range, Tstg –55 to 150 °C Junction temperature range, TJ –40 to 150 °C Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 300 C (1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions " is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2 Copyright © 2011, Texas Instruments Incorporated Product Folder Link(s) :TPS53316 |
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