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TPS2013DR Datasheet(PDF) 6 Page - Texas Instruments |
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TPS2013DR Datasheet(HTML) 6 Page - Texas Instruments |
6 / 21 page TPS2010, TPS2011, TPS2012, TPS2013 POWER-DISTRIBUTION SLVS097A – DECEMBER 1994 – REVISED AUGUST 1995 6 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 electrical characteristics over recommended operating junction temperature range, VI(IN) = 5.5 V, IO = rated current, EN = 0 V (unless otherwise noted) (continued) supply current PARAMETER TEST CONDITIONS TPS2010, TPS2011 TPS2012, TPS2013 UNIT PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Supply current low level output EN VI(IN) TJ = 25°C 0.015 1 µA Supply current, low-level output EN = VI(IN) –40 °C ≤ TJ ≤ 125°C 10 µA Supply current high level output EN =0V TJ = 25°C 73 100 µA Supply current, high-level output EN = 0 V –40 °C ≤ TJ ≤ 125°C 100 µA electrical characteristics over recommended operating junction temperature range, VI(IN) = 5.5 V, IO = rated current, EN = 0 V, TJ = 25°C (unless otherwise noted) power switch PARAMETER TEST CONDITIONS† TPS2010Y, TPS2011Y TPS2012Y, TPS2013Y UNIT PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VI(IN) = 5.5 V, 75 On state resistance VI(IN) = 4.5 V, 80 m Ω On-state resistance VI(IN) = 3 V, 120 m Ω VI(IN) = 2.7 V, 140 Output leakage current EN = VI(IN) 0.001 µA Output rise time VI(IN) = 5.5 V, CL = 1 µF 4 ms Output rise time VI(IN) = 2.7 V, CL = 1 µF 3.8 ms Output fall time VI(IN) = 5.5 V, CL = 1 µF 3.9 ms Output fall time VI(IN) = 2.7 V, CL = 1 µF 3.5 ms † Pulse-testing techniques maintain junction temperature close to ambient temperature; thermal effects must be taken into account separately. current limit PARAMETER TEST CONDITIONS† TPS2010Y, TPS2011Y TPS2012Y, TPS2013Y UNIT MIN TYP MAX Short-circuit current VI(IN) = 5.5 V, OUT connected to GND, Device enabled into short circuit 0.4 A † Pulse-testing techniques maintain junction temperature close to ambient temperature; thermal effects must be taken into account separately. supply current PARAMETER TEST CONDITIONS TPS2010Y, TPS2011Y TPS2012Y, TPS2013Y UNIT PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Supply current, low-level output EN = VI(IN) 0.015 µA Supply current, high-level output EN = 0 V 73 µA |
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