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HCPL-7520-560E Datasheet(PDF) 8 Page - AVAGO TECHNOLOGIES LIMITED |
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HCPL-7520-560E Datasheet(HTML) 8 Page - AVAGO TECHNOLOGIES LIMITED |
8 / 16 page 8 Notes: General Note:Typical values were taken from a sample of nominal units operating at nominal conditions (VDD1 =VDD2 = 5V,VREF = 4.0V,Temperature = 25°C) unless otherwise stated. Nominal plots shown from Figure 1 to 11 represented the drift of these nominal units from their nominal operating conditions. 1. Input Offset Voltage is defined as the DC Input Voltage required to obtain an output voltage of VREF/2. 2. Gain is defined as the slope of the best-fit line of the output voltage vs. the differential input voltage (VIN+ - VIN-) over the specified input range. Gain is derived from VREF/512 mV; e.g. VREF = 5.0, gain will be 9.77 V/V. 3. Nonlinearity is defined as half of the peak-to-peak output deviation from the best-fit gain line, expressed as a percentage of the full-scale output voltage range. 4. NL200 is the nonlinearity specified over an input voltage range of ±200 mV. 5. NL100 is the nonlinearity specified over an input voltage range of ±100 mV. 6. In accordance with UL1577, each optocoupler is proof tested by applying an insulation test voltage ≥ 4500 Vrms for 1 second (leakage detection current limit, II-O ≤ 5 µA). This test is performed before the 100% production test for the partial discharge (method b) shown in IEC/EN/DIN EN 60747-5-2 Insulation Characteristic Table, if applicable. 7. CMRR is defined as the ratio of the differential signal gain (signal applied differentially between pins 2 and 3) to the common-mode gain (input pins tied together and the signal applied to both inputs at the same time), expressed in dB. Switching Specifications (AC) Over recommended operating conditions unless otherwise specified. Parameter Symbol Min. Typ. Max. Units Test Conditions Fig. Note VIN to VOUT Signal Delay (50 – 10%) tPD10 2.2 4 µs VIN+ = 0 mV to 200 mV step 13 VIN to VOUT Signal Delay (50 – 50%) tPD50 3.4 5 µs VIN+ = 0 mV to 200 mV step 13 VIN to VOUT Signal Delay (50 – 90%) tPD90 5.2 9.9 µs VIN+ = 0 mV to 200 mV step 13 VOUT Rise Time (10 – 90%) tR 3.0 7 µs VIN+ = 0 mV to 200 mV step 13 VOUT Fall Time (10 – 90%) tF 3.2 7 µs VOUT Bandwidth (-3 dB) BW 50 100 kHz VIN+ = 200 mVpk-pk 14 VOUT Noise NOUT 31.5 mVrms VIN+ = 0 V Common Mode Transient CMTI 10 15 kV/µs TA = 25°C, VCM = 1000 V 15 Immunity Package Characteristics Parameter Symbol Min. Typ. Max. Units Test Conditions Fig. Note Input-Output Momentary VISO 3750 Vrms TA = 25°C, RH < 50% 6 Withstand Voltage Input-Output Resistance RI-O >109 Ω VI-O = 500 V Input-Output Capacitance CI-O 1.4 pF Freq = 1 MHz |
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