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TPS53515RVET Datasheet(PDF) 3 Page - Texas Instruments |
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TPS53515RVET Datasheet(HTML) 3 Page - Texas Instruments |
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3 / 33 page  TPS53515 www.ti.com SLUSBN5A – AUGUST 2013 – REVISED DECEMBER 2013 RECOMMENDED OPERATING CONDITIONS over operating free-air temperature range (unless otherwise noted) MIN MAX UNIT EN –0.1 7 SW –3 27 VBST –0.1 28 Input voltage range VBST(1) –0.1 5.5 V VDD 4.5 25 VIN 1.5 18 VO, FB, MODE, RF –0.1 5.5 Output voltage range PGOOD –0.1 7 V VREG, TRIP –0.1 5.5 TA Operating free-air temperature –40 85 °C (1) Voltage values are with respect to the SW pin. ELECTRICAL CHARACTERISTICS over operating free-air temperature range, VREG = 5 V, EN = 5 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT SUPPLY CURRENT TA = 25°C, No load IVDD VDD bias current 1350 1850 µA Power conversion enabled (no switching) TA = 25°C, No load IVDDSTBY VDD standby current 850 1150 µA Power conversion disabled IVIN(leak) VIN leakage current VEN = 0 V 0.5 µA VREF OUTPUT VVREF Reference voltage FB w/r/t GND, TA = 25°C 597 600 603 mV FB w/r/t GND, TJ = 0°C to 85°C –0.6% 0.5% VVREFTOL Reference voltage tolerance FB w/r/t GND, TJ = –40°C to 85°C –0.7% 0.5% OUTPUT VOLTAGE IFB FB input current VFB = 600 mV 50 100 nA IVODIS VO discharge current VVO = 0.5 V, Power Conversion Disabled 10 12 15 mA SMPS FREQUENCY VIN = 12 V, VVO = 3.3 V, RDR < 0.041 250 VIN = 12 V, VVO = 3.3 V, RDR = 0.096 300 VIN = 12 V, VVO = 3.3 V, RDR = 0.16 400 VIN = 12 V, VVO = 3.3 V, RDR = 0.229 500 fSW VO switching frequency(1) kHz VIN = 12 V, VVO = 3.3 V, RDR = 0.297 600 VIN = 12 V, VVO = 3.3 V, RDR = 0.375 750 VIN = 12 V, VVO = 3.3 V, RDR = 0.461 850 VIN = 12 V, VVO = 3.3 V, RDR > 0.557 1000 tON(min) Minimum on-time TA = 25°C (2) 60 ns tOFF(min) Minimum off-time TA = 25°C 175 240 310 ns INTERNAL BOOTSTRAP SW VF Forward Voltage VVREG–VBST, TA = 25°C, IF = 10 mA 0.15 0.25 V IVBST VBST leakage current TA = 25°C, VVBST = 33 V, VSW = 28 V 0.01 1.5 µA (1) Resistor divider ratio (RDR) is described in Equation 1. (2) Specified by design. Not production tested. Copyright © 2013, Texas Instruments Incorporated Submit Documentation Feedback 3 |
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