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CAT28F020HRA-90T Datasheet(PDF) 3 Page - ON Semiconductor |
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CAT28F020HRA-90T Datasheet(HTML) 3 Page - ON Semiconductor |
3 / 16 page CAT28F020 3 Doc. No. MD-1029, Rev. F © 2009 SCILLC. All rights reserved. Characteristics subject to change without notice CAPACITANCE TA = 25°C, f = 1.0 MHz Symbol Test Conditions Min Typ Max Units CIN(3) Input Pin Capacitance VIN = 0V 6 pF COUT(3) Output Pin Capacitance VOUT = 0V 10 pF CVPP(3) VPP Supply Capacitance VPP = 0V 25 pF ABSOLUTE MAXIMUM RATINGS* Temperature Under Bias ................. –45 °C to +130°C Storage Temperature ....................... –65 °C to +150°C Voltage on Any Pin with Respect to Ground(1) ........... –2.0V to +VCC + 2.0V Voltage on Pin A9 with Respect to Ground(1) ................... –2.0V to +13.5V VPP with Respect to Ground during Program/Erase(1) .............. –2.0V to +14.0V VCC with Respect to Ground(1) ............ –2.0V to +7.0V Package Power Dissipation Capability (TA = 25 °C) .................................. 1.0 W Lead Soldering Temperature (10 secs) ............ 300 °C Output Short Circuit Current(2) ........................ 100 mA RELIABILITY CHARACTERISTICS Symbol Parameter Test Method Min Typ Max Units NEND(3) Endurance MIL-STD-883, Test Method 1033 100K Cycles/Byte TDR(3) Data Retention MIL-STD-883, Test Method 1008 10 Years VZAP(3) ESD Susceptibility MIL-STD-883, Test Method 3015 2000 Volts ILTH(3)(4) Latch-Up JEDEC Standard 17 100 mA Note: 1. The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC voltage on output pins is VCC +0.5V, which may overshoot to VCC + 2.0V for periods of less than 20ns. 2. Output shorted for no more than one second. No more than one output shorted at a time. 3. This parameter is tested initially and after a design or process change that affects the parameter. 4. Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to VCC +1V. *COMMENT Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability. |
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