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ADS8887IDGSR Datasheet(PDF) 3 Page - Texas Instruments

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No. de pieza ADS8887IDGSR
Descripción Electrónicos  18-Bit, 100-kSPS, Serial Interface, microPower, Miniature, True-Differential Input, SAR Analog-to-Digital Converter
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Fabricante Electrónico  TI [Texas Instruments]
Página de inicio  http://www.ti.com
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ADS8887IDGSR Datasheet(HTML) 3 Page - Texas Instruments

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ADS8887
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SBAS613A – MAY 2013 – REVISED DECEMBER 2013
ELECTRICAL CHARACTERISTICS
All minimum and maximum specifications are at TA = –40°C to +85°C, AVDD = 3 V, DVDD = 3 V, VREF = 5 V,
VCM = VREF / 2 V, and fSAMPLE = 100 kSPS, unless otherwise noted.
Typical specifications are at TA = +25°C, AVDD = 3 V, and DVDD = 3 V.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
ANALOG INPUT
Full-scale input span(1)(2)
AINP – AINN
–VREF
VREF
V
AINP
–0.1
VREF + 0.1
V
Operating input range(1)(2)
AINN
–0.1
VREF + 0.1
V
VCM
Input common-mode range
0
VREF / 2
VREF
V
CI
Input capacitance
AINP and AINN terminal to GND
59
pF
Input leakage current
During acquisition for dc input
5
nA
SYSTEM PERFORMANCE
Resolution
18
Bits
NMC
No missing codes
18
Bits
DNL
Differential linearity
–0.99
±0.7
1.5
LSB(3)
INL
Integral linearity(4)
–3
±1.5
3
LSB(3)
EO
Offset error(5)
–4
±1
4
mV
Offset error drift with temperature
±1.5
µV/°C
EG
Gain error
–0.01
±0.005
0.01
%FSR
Gain error drift with temperature
±0.15
ppm/°C
CMRR
Common-mode rejection ratio
With common-mode input signal = 5 VPP at dc
90
100
dB
PSRR
Power-supply rejection ratio
At mid-code
80
dB
Transition noise
0.7
LSB
SAMPLING DYNAMICS
tconv
Conversion time
500
8800
ns
tACQ
Acquisition time
1200
ns
Maximum throughput rate
100
kHz
with or without latency
Aperture delay
4
ns
Aperture jitter, RMS
5
ps
Step response
Settling to 18-bit accuracy
1200
ns
Overvoltage recovery
Settling to 18-bit accuracy
1200
ns
(1)
Ideal input span, does not include gain or offset error.
(2)
Specified for VCM = VREF / 2. Refer to the Analog Input section for the effect of VCM on the full-scale input range.
(3)
LSB = least significant bit.
(4)
This parameter is the endpoint INL, not best-fit.
(5)
Measured relative to actual measured reference.
Copyright © 2013, Texas Instruments Incorporated
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