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CAT28HT64D-20 Datasheet(PDF) 3 Page - Catalyst Semiconductor |
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CAT28HT64D-20 Datasheet(HTML) 3 Page - Catalyst Semiconductor |
3 / 10 page CAT28HT64 8-41 Advanced Stock No. 21064-04 2/98 D.C. OPERATING CHARACTERISTICS VCC = 5V ±10%, unless otherwise specified. (Temperature 0˚C to 170˚C) Limits Symbol Parameter Min. Typ. Max. Units Test Conditions ICC VCC Current (Operating, TTL) 30 mA CE = OE = VIL, f = 1/tRC min, All I/O’s Open ICCC(1) VCC Current (Operating, CMOS) 25 mA CE = OE = VILC, f = 1/tRC min, All I/O’s Open ISB VCC Current (Standby, TTL) 1 mA CE = VIH, All I/O’s Open ISBC(2) VCC Current (Standby, CMOS) 300 µA CE = VIHC, All I/O’s Open ILI Input Leakage Current –10 20 µAVIN = GND to VCC ILO Output Leakage Current –10 20 µAVOUT = GND to VCC, CE = VIH VIH(2) High Level Input Voltage 2 VCC +0.3 V VIL(1) Low Level Input Voltage –0.3 0.8 V VOH High Level Output Voltage 2.4 V IOH = –400 µA VOL Low Level Output Voltage 0.4 V IOL = 2.1mA VWI Write Inhibit Voltage 3.5 V Note: (1) VILC = –0.3V to +0.3V. (2) VIHC = VCC –0.3V to VCC +0.3V. (3) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC voltage on output pins is VCC +0.5V, which may overshoot to VCC +2.0V for periods of less than 20 ns. (4) Output shorted for no more than one second. No more than one output shorted at a time. ABSOLUTE MAXIMUM RATINGS* Temperature Under Bias ................. –55 °C to +170°C Storage Temperature ....................... –65 °C to +170°C Voltage on Any Pin with Respect to Ground(3) ........... –2.0V to +VCC + 2.0V VCC with Respect to Ground ............... –2.0V to +7.0V Package Power Dissipation Capability (Ta = 25 °C)................................... 1.0W Lead Soldering Temperature (10 secs) ............ 300 °C Output Short Circuit Current(4) ........................ 100 mA *COMMENT Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specifica- tion is not implied. Exposure to any absolute maximum rating for extended periods may affect device perfor- mance and reliability. |
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