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CAT28F102N-90T Datasheet(PDF) 5 Page - Catalyst Semiconductor |
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CAT28F102N-90T Datasheet(HTML) 5 Page - Catalyst Semiconductor |
5 / 14 page CAT28F102 5 Doc. No. 25038-0A 2/98 F-1 INPUT PULSE LEVELS REFERENCE POINTS 2.0 V 0.8 V 2.4 V 0.45 V 5108 FHD F04 Note: (1) This parameter is tested initially and after a design or process change that affects the parameter. (2) Output floating (High-Z) is defined as the state where the external data line is no longer driven by the output buffer. (3) Input Rise and Fall Times (10% to 90%) < 10 ns. (4) Input Pulse Levels = 0.45V and 2.4V. For high speed input pulse levels 0.0V and 3.0V. (5) Input and Output Timing Reference = 0.8V and 2.0V. For high speed input and output timing reference=1.5V. (6) Low-Z is defined as the state where the external data may be driven by the output buffer but may not be valid. (7) For Load and Reference Points see Figures 3 and 4 (8) For Load and Reference Points see Figures 1 and 2 1.3V DEVICE UNDER TEST 1N914 3.3K CL = 100 pF OUT CL INCLUDES JIG CAPACITANCE INPUT PULSE LEVELS REFERENCE POINTS 2.0 V 0.8 V 2.4 V 0.45 V 5108 FHD F03 Figure 1. A.C. Testing Input/Output Waveform(3)(4)(5) Figure 2. A.C. Testing Load Circuit (example) Figure 3. High Speed A.C. Testing Input/Output Waveform(3)(4)(5) JEDEC Standard 28F102-45(7) 28F102-55(7) 28F102-70 (7) 28F102- 90 (8) Symbol Symbol Parameter Min. Max. Min. Max. Min. Max. Min. Max Unit tAVAV tRC Read Cycle Time 45 55 70 90 ns tELQV tCE CE Access Time 45 55 70 90 ns tAVQV tACC Address Access Time 45 55 70 90 ns tGLQV tOE OE Access Time 20 25 28 35 ns tAXQX tOH Output Hold from Address 0 0 0 0 ns OE/CE Chan tGLQX tOLZ(1)(6) OE to Output in Low-Z 0 0 0 0 ns tELQX tLZ(1)(6) CE to Output in Low-Z 0 0 0 0 ns tGHQZ tDF(1)(2) OE High to Output High-Z 15 15 18 20 ns tEHQZ(1)(2) - CE High to Output High-Z 15 15 25 30 ns tWHGL Write Recovery Time Before 6 6 6 6 µs Read 3V 0.0 A.C. CHARACTERISTICS, Read Operation 1.3V DEVICE UNDER TEST 1N914 3.3K CL = 100 pF OUT CL INCLUDES JIG CAPACITANCE Figure 4. High Speed A.C. Testing Load Circuit (example) V CC = +5V ±10%, unless otherwise specified 1.5V Vcc=5V+5% 30 Vcc=5V+5% |
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