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LM3224 Datasheet(PDF) 4 Page - Texas Instruments |
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LM3224 Datasheet(HTML) 4 Page - Texas Instruments |
4 / 26 page LM3224 SNVS277B – DECEMBER 2004 – REVISED SEPTEMBER 2005 www.ti.com Absolute Maximum Ratings (1) VIN 7.5V SW Voltage 21V FB Voltage (2) 7V VC Voltage (3) 1.26V ± 0.3V SHDN Voltage 7.5V FSLCT 7.5V Maximum Junction Temperature 150°C Power Dissipation(4) Internally Limited Lead Temperature 300°C Vapor Phase (60 sec.) 215°C Infrared (15 sec.) 220°C ESD Susceptibility (5) Human Body Model 2kV Machine Model 200V (1) Absolute maximum ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions for which the device is intended to be functional, but device parameter specifications may not be guaranteed. For guaranteed specifications and test conditions, see the Electrical Characteristics. (2) The FB pin should never exceed VIN. (3) Under normal operation the VC pin may go to voltages above this value. This maximum rating is for the possibility of a voltage being applied to the pin, however the VC pin should never have a voltage directly applied to it. (4) The maximum allowable power dissipation is a function of the maximum junction temperature, TJ(MAX), the junction-to-ambient thermal resistance, θJA, and the ambient temperature, TA. The maximum allowable power dissipation at any ambient temperature is calculated using: PD (MAX) = (TJ(MAX) − TA)/θJA. Exceeding the maximum allowable power dissipation will cause excessive die temperature, and the regulator will go into thermal shutdown. (5) The human body model is a 100 pF capacitor discharged through a 1.5k Ω resistor into each pin. The machine model is a 200pF capacitor discharged directly into each pin. Operating Conditions Operating Junction Temperature Range (1) −40°C to +125°C Storage Temperature −65°C to +150°C Supply Voltage 2.7V to 7V Maximum Output Voltage 20V (1) All limits guaranteed at room temperature (standard typeface) and at temperature extremes (bold typeface). All room temperature limits are 100% production tested. All limits at temperature extremes are guaranteed via correlation using standard Statistical Quality Control (SQC) methods. All limits are used to calculate Average Outgoing Quality Level (AOQL). 4 Submit Documentation Feedback Copyright © 2004–2005, Texas Instruments Incorporated Product Folder Links: LM3224 |
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