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AD5531 Datasheet(PDF) 3 Page - Analog Devices

No. de pieza AD5531
Descripción Electrónicos  Serial Input, Voltage Output 12-/14-Bit Digital-to-Analog Converters
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Fabricante Electrónico  AD [Analog Devices]
Página de inicio  http://www.analog.com
Logo AD - Analog Devices

AD5531 Datasheet(HTML) 3 Page - Analog Devices

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AD5530/AD5531
Rev. B | Page 3 of 20
SPECIFICATIONS
VDD = 15 V ± 10%; VSS = −15 V ± 10%; GND = 0 V; RL = 5 kΩ and CL = 220 pF to GND. All specifications TMIN to TMAX, unless otherwise noted.
Table 1.
Parameter1
AD5530
AD5531
Unit
Test Conditions/Comments
ACCURACY
Resolution
12
14
Bits
Relative Accuracy
±1
±2
LSB max
Differential Nonlinearity
±1
±1
LSB max
Guaranteed monotonic over temperature
Zero-Scale Error
±2
±8
LSB max
Typically within ±1 LSB
Full-Scale Error
±2
±8
LSB max
Typically within ±1 LSB
Gain Error
±1
±4
LSB typ
Gain Temperature Coefficient2
0.5
0.5
ppm FSR/°C typ
10
10
ppm FSR/°C max
REFERENCE INPUTS2
Reference Input Range
0 to 5
0 to 5
V min to V max
Max output range ±10 V
DC Input Resistance
100
100
MΩ typ
Input Current
±1
±1
μA max
Per input, typically ±20 nA
DUTGND INPUT2
DC Input Impedance
60
60
kΩ typ
Max Input Current
±0.3
±0.3
mA typ
Input Range
−4 to +4
−4 to +4
V min to V max
Max output range ±10 V
O/P CHARACTERISTICS2
Output Voltage Swing
±10
±10
V max
Short-Circuit Current
15
15
mA max
Resistive Load
5
5
kΩ min
To 0 V
Capacitive Load
1200
1200
pF max
To 0 V
DC Output Impedance
0.5
0.5
Ω max
DIGITAL I/O
VINH, Input High Voltage
2.4
2.4
V min
VINL, Input Low Voltage
0.8
0.8
V max
IINH, Input Current
±10
±10
μA max
Total for all pins
CIN, Input Capacitance2
10
10
pF max
3 pF typical
SDO VOL, Output Low Voltage
0.4
0.4
V max
ISINK = 1 mA
POWER REQUIREMENTS
VDD/VSS
+15/−15
+15/−15
V nom
±10% for specified performance
Power Supply Sensitivity
ΔFull Scale/ΔVDD
110
110
dB typ
ΔFull Scale/ΔVSS
100
100
dB typ
IDD
2
2
mA max
Outputs unloaded
ISS
2
2
mA max
Outputs unloaded
IDD in Power-Down
150
150
μA max
Typically 50 μA
1 Temperature range for B Version: −40°C to +85°C.
2 Guaranteed by design, not subject to production test.


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