AMC1203

SBAS427C

– FEBRUARY 2008 – REVISED JUNE 2011

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

SPECIFIED

PACKAGE

TEMPERATURE

PACKAGE

ORDERING

TRANSPORT MEDIA,

PRODUCT

PACKAGE-LEAD

DESIGNATOR

RANGE

MARKING

NUMBER

QUANTITY

AMC1203DUB

Tube, 50

SOP-8 Gull-Wing

DUB

–40°C to +105°C

AMC1203

AMC1203DUBR

Tape and Reel, 350

AMC1203PSA

Tube, 95

AMC1203

SOP-8

PSA

–40°C to +105°C

1203

AMC1203PSAR

Tape and Reel, 2000

AMC1203DW

Tube, 40

SOIC-16

DW

–40°C to +105°C

AMC1203

AMC1203DWR

Tape ad Reel, 2000

AMC1203BDUB

Tube, 50

SOP-8 Gull-Wing

DUB

–40°C to +105°C

AMC1203

AMC1203BDUBR

Tape and Reel, 350

AMC1203BPSA

Tube, 95

AMC1203B

SOP-8

PSA

–40°C to +105°C

1203

AMC1203BPSAR

Tape and Reel, 2000

AMC1203BDW

Tube, 40

SOIC-16

DW

–40°C to +105°C

AMC1203

AMC1203BDWR

Tape and Reel, 2000

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the

device product folder on www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range, unless otherwise noted.

PARAMETER

AMC1203

UNIT

–0.3 to +6

V

GND1

V

Input current to any pin except supply pins

±10

mA

Continuous total power dissipation

See Dissipation Ratings Table

+150

°C

Human body model (HBM)

±3000

V

JEDEC standard 22, test method A114-C.01

Charged device Model (CDM)

Electrostatic discharge (ESD), all pins

±1500

V

JEDEC standard 22, test method C101

Machine Model (MM)

±200

V

JEDEC standard 22, test method A115A

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under the Recommended Operating

Conditions is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability.

2

Copyright

© 2008–2011, Texas Instruments Incorporated