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AMC1203BPSAR Datasheet(PDF) 2 Page - Texas Instruments |
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AMC1203BPSAR Datasheet(HTML) 2 Page - Texas Instruments |
2 / 29 page AMC1203 SBAS427C – FEBRUARY 2008 – REVISED JUNE 2011 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE/ORDERING INFORMATION(1) SPECIFIED PACKAGE TEMPERATURE PACKAGE ORDERING TRANSPORT MEDIA, PRODUCT PACKAGE-LEAD DESIGNATOR RANGE MARKING NUMBER QUANTITY AMC1203DUB Tube, 50 SOP-8 Gull-Wing DUB –40°C to +105°C AMC1203 AMC1203DUBR Tape and Reel, 350 AMC1203PSA Tube, 95 AMC1203 SOP-8 PSA –40°C to +105°C 1203 AMC1203PSAR Tape and Reel, 2000 AMC1203DW Tube, 40 SOIC-16 DW –40°C to +105°C AMC1203 AMC1203DWR Tape ad Reel, 2000 AMC1203BDUB Tube, 50 SOP-8 Gull-Wing DUB –40°C to +105°C AMC1203 AMC1203BDUBR Tape and Reel, 350 AMC1203BPSA Tube, 95 AMC1203B SOP-8 PSA –40°C to +105°C 1203 AMC1203BPSAR Tape and Reel, 2000 AMC1203BDW Tube, 40 SOIC-16 DW –40°C to +105°C AMC1203 AMC1203BDWR Tape and Reel, 2000 (1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the device product folder on www.ti.com. ABSOLUTE MAXIMUM RATINGS (1) Over operating free-air temperature range, unless otherwise noted. PARAMETER AMC1203 UNIT Supply voltage, VDD1 to GND1 or VDD2 to GND2 –0.3 to +6 V Analog input voltage at VIN+, VIN– GND1 – 0.3 to VDD1 + 0.3 V Input current to any pin except supply pins ±10 mA Continuous total power dissipation See Dissipation Ratings Table Maximum junction temperature, TJ +150 °C Human body model (HBM) ±3000 V JEDEC standard 22, test method A114-C.01 Charged device Model (CDM) Electrostatic discharge (ESD), all pins ±1500 V JEDEC standard 22, test method C101 Machine Model (MM) ±200 V JEDEC standard 22, test method A115A (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under the Recommended Operating Conditions is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability. 2 Copyright © 2008–2011, Texas Instruments Incorporated |
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