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DAC161P997 Datasheet(PDF) 5 Page - Texas Instruments |
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DAC161P997 Datasheet(HTML) 5 Page - Texas Instruments |
5 / 39 page DAC161P997 www.ti.com SNAS515G – JULY 2011 – REVISED DECEMBER 2014 6.2 ESD Ratings VALUE UNIT Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±5500 V(ESD) Electrostatic discharge V Charged-device model (CDM), per JEDEC specification JESD22- ±1250 C101(2) (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.3 Recommended Operating Conditions MIN MAX UNIT Supply Voltage Range 2.7 3.6 V (VA - VD) 0 0 V (COMA - COMD) 0 0 V BASE load to COMA 0 15 pF OUT load to COMA - - Operating Temperature (TA) -40 105 °C 6.4 Thermal Information THERMAL METRIC(1) WQFN (16-PINS) UNIT RθJA Junction-to-ambient thermal resistance 35 °C/W (1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. 6.5 Electrical Characteristics Unless otherwise noted, these specifications apply for VA = VD = 2.7 V to 3.6 V, TA = 25°C, external bipolar transistor: 2N3904, RE = 22Ω, C1 = C2 = C3 = 2.2 nF. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT POWER SUPPLY VA, VD Supply Voltage VA = VD 2.7 3.6 V VA Supply Current 75 µA DACCODE=0x0200(1) VD Supply Current 115 µA -40 to 105°C Total Supply Current 190 µA Power On Reset supply rail VPOR 1.3 1.9 V potential threshold DC ACCURACY N Resolution 16 Bits 0x2AAA < DACCODE < 0xD555 INL Integral Non-Linearity(2) (4mA < ILOOP < 20 mA) –2.1 3.3 -40 to 105°C µA See(3) DNL Differential Non-Linearity –0.2 0.2 -40 to 105°C TUE Total Unadjusted Error 0x2AAA < DACCODE < 0xD555 –0.23% 0.23% FS See(4) OE Offset Error −9.16 9.16 µA -40 to 105°C Offset Error Temp. Coefficient 138 nA/°C (1) At code 0x0200 the BASE current is minimal, i.e., device current contribution to power consumption is minimized. The SWIF link is inactive, i.e., after transmitting code 0x200 to the DAC161P997, there are no more transitions in the channel during the supply current measurement. (2) INL is measured using “best fit” method in the output current range of 4 mA to 20 mA. (3) Specified by design. (4) Here offset is the y-intercept of the straight line defined by 4-mA and 20-mA points of the measured transfer characteristic. Copyright © 2011–2014, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: DAC161P997 |
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