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CSD97395Q4M Datasheet(PDF) 11 Page - Texas Instruments |
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CSD97395Q4M Datasheet(HTML) 11 Page - Texas Instruments |
11 / 22 page Switching Frequency (kHz) 200 600 1000 1400 1800 2200 0 4 8 12 16 20 24 28 32 36 40 44 D010 Junction Temperature (GC) -75 -50 -25 0 25 50 75 100 125 150 8.5 9 9.5 10 10.5 11 D011 Output Voltage (V) 0 0.5 1 1.5 2 2.5 3 3.5 4 0.6 -7.2 0.7 -5.4 0.8 -3.6 0.9 -1.8 1 0.0 1.1 1.8 1.2 3.6 1.3 5.4 1.4 7.2 1.5 9.0 D008 Output Inductance (nH) 0 100 200 300 400 500 600 700 800 900 1000 1100 0.9 -1.8 0.95 -0.9 1 0.0 1.05 0.9 1.1 1.8 1.15 2.7 1.2 3.5 1.25 4.4 D009 CSD97395Q4M www.ti.com SLPS541A – DECEMBER 2014 – REVISED MARCH 2015 Typical Application (continued) TJ = 125°C, unless stated otherwise. VIN = 12 V VDD = 5 V IOUT = 25 A VIN = 12 V VDD = 5 V IOUT = 25 A ƒSW = 500 kHz LOUT = 0.29 µH ƒSW = 500 kHz VOUT = 1.8 V Figure 10. Normalized Power Loss vs Output Voltage Figure 11. Normalized Power Loss vs Output Inductance VIN = 12 V VDD = 5 V IOUT = 25 A VIN = 12 V VDD = 5 V VOUT = 1.8 V LOUT = 0.29 µH VOUT = 1.8 V IOUT = 25 A LOUT = 0.29 µH Figure 12. Driver Current vs Frequency Figure 13. Driver Current vs Temperature 1. The Typical CSD97395Q4M System Characteristic curves are based on measurements made on a PCB design with dimensions of 4.0" (W) × 3.5" (L) × 0.062" (T) and 6 copper layers of 1 oz. copper thickness. See System Example for detailed explanation. 8.3 System Example 8.3.1 Power Loss Curves MOSFET centric parameters such as RDS(ON) and Qgd are primarily needed by engineers to estimate the loss generated by the devices. In an effort to simplify the design process for engineers, Texas Instruments has provided measured power loss performance curves. Figure 4 plots the power loss of the CSD97395Q4M as a function of load current. This curve is measured by configuring and running the CSD97395Q4M as it would be in the final application (see Figure 14). The measured power loss is the CSD97395Q4M device power loss which consists of both input conversion loss and gate drive loss. Equation 1 is used to generate the power loss curve. Power Loss = (VIN x IIN) + (VDD x IDD) – (VSW_AVG x IOUT) (1) The power loss curve in Figure 4 is measured at the maximum recommended junction temperature of TJ = 125°C under isothermal test conditions. Copyright © 2014–2015, Texas Instruments Incorporated Submit Documentation Feedback 11 |
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