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27C512A Datasheet(PDF) 3 Page - Microchip Technology

No. de pieza 27C512A
Descripción Electrónicos  512K (64K x 8) CMOS EPROM
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Fabricante Electrónico  MICROCHIP [Microchip Technology]
Página de inicio  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

27C512A Datasheet(HTML) 3 Page - Microchip Technology

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© 1996 Microchip Technology Inc.
DS11173E-page 3
27C512A
TABLE 1-3:
READ OPERATION AC CHARACTERISTICS
FIGURE 1-1:
READ WAVEFORMS
AC Testing Waveform:
VIH = 2.4V and VIL = .45V; VOH = 2.0V and VOL = 0.8V
Output Load:
1 TTL Load + 100 pF
Input Rise and Fall Times:
10 ns
Ambient Temperature:
Commercial:
Tamb =
0˚C to +70˚C
Industrial:
Tamb = -40˚C to +85˚C
Extended (Automotive):
Tamb = -40˚C to +125˚C
Parameter
Sym
27C512-90*
27C512-10*
27C512-12
27C512-15
Units Conditions
Min
Max
Min
Max
Min
Max
Min
Max
Address to Output
Delay
tACC
—
90
—
100
—
120
—
150
ns
CE = OE/
VPP = VIL
CE to Output Delay
tCE
—
90
—
100
—
120
—
150
ns
OE/VPP =
VIL
OE to Output Delay
tOE
—40—40—50—60
ns
CE = VIL
OE to Output High
Impedance
tOFF
035035040045
ns
Output Hold from
Address, CE or OE/
VPP, whichever
occurred first
tOH
0—0—0—0—
ns
*90/10 AC Testing Waveforms: VIH = 3.0V and VIL = 0V; VOH = 1.5V and VOL = 1.5V
Output Load: 1 TTL Load + 30 pF
Address
CE
VIH
VIL
VIH
VIL
VIH
VIL
OE
Outputs
O0 - O7
VOH
VOL
Address Valid
tCE(2)
tOE(2)
High Z
Valid Output
tACC
(1) tOFF is specified for OE or CE, whichever occurs first
(2) OE may be delayed up to t CE - t OE after the falling edge of CE without impact on tCE
(3) This parameter is sampled and is not 100% tested.
High Z
tOH
tOFF(1,3)
Notes:


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