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TPS54362-HT Datasheet(PDF) 7 Page - Texas Instruments |
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TPS54362-HT Datasheet(HTML) 7 Page - Texas Instruments |
7 / 34 page 1000 10000 100000 1000000 10000000 120 140 160 180 200 Operating Junction Temperature ( °C) TPS54362-HT www.ti.com SLVSBI9 – SEPTEMBER 2012 (1) See data sheet for absolute maximum and minimum recommended operating conditions. (2) Silicon operating life design goal is 10 years at 105°C junction temperature (does not include package interconnect life). (3) The predicted operating lifetime vs. junction temperature is based on reliability modeling using electromigration as the dominant failure mechanism affecting device wearout for the specific device process and design characteristics. (4) This device is qualified for 1000 hours of continuous operation at maximum rated temperature. Figure 1. Electromigration Fail Mode Derating Chart Copyright © 2012, Texas Instruments Incorporated Submit Documentation Feedback 7 Product Folder Links : TPS54362-HT |
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