CAT9557

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5

Table 3. RELIABILITY CHARACTERISTICS

Parameter

Symbol

Reference Test Method

Min

Units

ESD Susceptibility

JEDEC Standard JESD 22

2000

V

Latch−up

JEDEC Standard 17

100

mA

2. This parameter is tested initially and after a design or process change that affects the parameter.

3. Latch−up protection is provided for stresses up to 100 mA on address and data pins from −1 V to VDD +1 V.

Table 4. D.C. OPERATING CHARACTERISTICS

Rating

Symbol

Conditions

Min

Typ

Max

Unit

SUPPLIES

Supply voltage

2.3

−

5.5

V

Supply current

−

19

25

mA

LOW−level standby current

I/O = inputs

−

0.25

3

mA

HIGH−level standby current

I/O = inputs

−

0.25

1

mA

Additional standby current

−

0.8

1

mA

Power−on reset voltage (Note 4)

−

1.65

2.1

V

INPUT SCL, RESET; INPUT/OUTPUT SDA

LOW−level input voltage

−0.5

−

V

HIGH−level input voltage

−

V

LOW−level output current

3

−

−

mA

Leakage current

−1

−

+1

mA

Input capacitance (Note 5)

−

6

10

pF

I/Os

LOW−level input voltage

−0.5

−

+0.8

V

HIGH−level input voltage

2.0

−

5.5

V

LOW−level output current (Note 6)

8

10

−

mA

HIGH−level output current (Note 7)

−4

−

−

mA

−

−

1

mA

Input leakage current

−

−

−100

mA

Input capacitance (Note 5)

−

−

5

pF

Output capacitance (Note 5)

−

−

5

pF

SELECT INPUTS A0, A1, A2

LOW−level input voltage

−0.5

−

+0.8

V

HIGH−level input voltage

2.0

−

5.5

V

Input leakage current

−1

−

+1

mA

5. This parameter is characterized initially and after a design or process change that affects the parameter. Not 100% tested.

6. The total amount sunk by all I/Os must be limited to 100 mA and 25 mA per bit.

7. The total current sourced by all I/Os must be limited to 85 mA and 20 mA per bit.