LM45

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SNIS117C – AUGUST 1999 – REVISED FEBRUARY 2013

Electrical Characteristics

Parameter

Conditions

LM45B

LM45C

Units

(Limit)

Typical

Typical

±2.0

±3.0

±3.0

±4.0

°C (max)

±3.0

±4.0

±0.8

±0.8

°C (max)

Sensor Gain (Average Slope)

+9.7

+9.7

mV/°C (min)

+10.3

+10.3

mV/°C (max)

0

±35

±35

mV/mA (max)

+4.0V

±0.80

±0.80

mV/V (max)

±1.2

±1.2

+4.0V

120

120

μA (max)

+4.0V

160

160

4.0V

2.0

2.0

μA (max)

Temperature Coefficient of

+2.0

+2.0

μA/°C

Quiescent Current

Minimum Temperature for Rated

+2.5

+2.5

°C (min)

Accuracy

±0.12

±0.12

°C

(1)

Limits are guaranteed to TI's AOQL (Average Outgoing Quality Level).

(2)

Accuracy is defined as the error between the output voltage and 10 mv/°C times the device's case temperature, at specified conditions

of voltage, current, and temperature (expressed in °C).

(3)

Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device's

rated temperature range.

(4)

Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating

effects can be computed by multiplying the internal dissipation by the thermal resistance.

(5)

Quiescent current is measured using the circuit of Figure 2.

(6)

For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature

cycled for at least 46 hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered;

allow time for stress relaxation to occur.

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