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LMX2531LQE1515E Datasheet(PDF) 6 Page - Texas Instruments |
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LMX2531LQE1515E Datasheet(HTML) 6 Page - Texas Instruments |
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6 / 48 page  LMX2531 SNAS252S – OCTOBER 2005 – REVISED DECEMBER 2014 www.ti.com 7.5 Electrical Characteristics (VCC = 3.0 V, –40°C ≤ TA ≤ 85 °C; except as specified.) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT CURRENT CONSUMPTION LMX2531LQ2265E/ 38 44 2570E Divider Disabled LMX2531LQ2820E/ 38 46 3010E All Other Options 34 41 Power Supply Current Power ICC mA Supply Current LMX2531LQ2265E/ 41 49 2570E Divider Enabled LMX2531LQ2820E/ 44 52 3010E All Other Options 37 46 ICCPD Power Down Current CE = 0 V, Part Initialized 7 µA OSCILLATOR IIHOSC Oscillator Input High Current VIH = 2.75 V 100 µA IILOSC Oscillator Input Low Current VIL = 0 –100 µA fOSCin Frequency Range See(1) 5 80 MHz vOSCin Oscillator Sensitivity 0.5 2.0 Vpp PLL fPD Phase Detector Frequency 32 MHz ICP = 0 90 µA ICP = 1 180 µA Charge Pump ICPout Output Current Magnitude ICP = 3 360 µA ICP = 15 1440 µA ICPoutTRI CP TRI-STATE Current 0.4 V < VCPout < 2.0 V 2 10 nA Charge Pump VCPout = 1.2 V ICPoutMM 2% 8% Sink vs Source Mismatch TA = 25°C Charge Pump 0.4 V < VCPout < 2.0 V ICPoutV 4% Current vs CP Voltage Variation TA = 25°C CP Current vs Temperature ICPoutT VCPout = 1.2 V 8% Variation Normalized PLL 1/f Noise ICP = 1X Charge Pump Gain –94 LNPLL_flicker(10 kHz) dBc/Hz ICP = 16X Charge Pump Gain –104 See(2) LN(f) Normalized PLL Noise Floor ICP = 1X Charge Pump Gain –202 LNPLL_flat dBc/Hz ICP = 16X Charge Pump Gain –212 See(3) (1) There are program bits that need to be set based on the OSCin frequency. Refer to the following sections: XTLSEL[2:0] -- OSCin Select, XTLDIV[1:0] -- Division Ratio for the OSCin Frequency, XTLMAN[11:0] -- Manual OSCin Mode, XTLMAN2 -- Manual Crystal Mode Second Adjustment, and LOCKMODE -- Frequency Calibration Mode. Not all bit settings can be used for all frequency choices of OSCin. For instance, automatic modes described in XTLSEL[2:0] -- OSCin Select do not work below 8 MHz. (2) One of the specifications for modeling PLL in-band phase noise is the PLL 1/f noise normalized to 1 GHz carrier frequency and 10 kHz offset, LPLL_flicker(10 kHz). From this normalized index of PLL 1/f noise, the PLL 1/f noise can be calculated for any carrier and offset frequency as: LNPLL_flicker(f) = LPLL_flicker(10 kHz) – 10 × log (10 kHz / f) + 20 × log ( Fout / 1 GHz ). Flicker noise can dominate at low offsets from the carrier and has a 10 dB/decade slope and improves with higher charge pump currents and at higher offset frequencies . To accurately measure LPLL_flicker(10 kHz) it is important to use a high phase detector frequency and a clean reference to make it such that this measurement is on the 10 dB/decade slope close to the carrier. LPLL_flicker(f) can be masked by the reference oscillator performance if a low power or noisy source is used. The total PLL in-band phase noise performance is the sum of LPLL_flicker(f) and LPLL_flat. In other words,LPLL(f) = 10 × log (10 ( LN PLL_flat / 10 ) + 10(LN PLL_flicker (f) / 10 ) (3) A specification used for modeling PLL in-band phase noise floor is the Normalized PLL noise floor, LNPLL_flat, and is defined as: LNPLL_flat = L(f) – 20 × log (N) – 10 × log(fPD). LPLL_flat is the single side band phase noise in a 1 Hz Bandwidth and fPD is the phase detector frequency of the synthesizer. LPLL_flat contributes to the total noise, L(f). To measure LPLL_flat the offset frequency must be chosen sufficiently smaller then the loop bandwidth of the PLL, and yet large enough to avoid a substantial noise contribution from the reference and PLL flicker noise. LPLL_flat can be masked by the reference oscillator performance if a low power or noisy source is used. The total PLL in-band phase noise performance is the sum of LPLL_flicker(f) and LPLL_flat. In other words, LPLL(f) = 10 × log (10 ( LN PLL_flat / 10 ) + 10 (LN PLL_flicker (f) / 10 ) 6 Submit Documentation Feedback Copyright © 2005–2014, Texas Instruments Incorporated Product Folder Links: LMX2531 |
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