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SN74AHC08PWE4 Datasheet(PDF) 4 Page - Texas Instruments

No. de pieza SN74AHC08PWE4
Descripción Electrónicos  Quadruple 2-Input Positive-AND Gates
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SN74AHC08PWE4 Datasheet(HTML) 4 Page - Texas Instruments

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SN74AHC08, SN54AHC08
SCLS236J – MARCH 1996 – REVISED DECEMBER 2015
www.ti.com
Pin Functions
PIN
SOIC, SSOP,
I/O
DESCRIPTION
NAME
TVSOP, PDIP,
VQFN
LCCC
SO, TSSOP
1A
1
1
2
I
1A Input
1B
2
2
3
I
1B Input
1Y
3
3
4
O
1Y Output
2A
4
4
6
I
2A Input
2B
5
5
8
I
2B Input
2Y
6
6
9
O
2Y Output
3Y
8
8
12
O
3Y Output
3A
9
9
13
I
3A Input
3B
10
10
14
I
3B Input
4Y
11
11
16
O
4Y Output
4A
12
12
18
I
4A Input
4B
13
13
19
I
4B Input
GND
7
7
10
Ground Pin
NC
1, 5, 7, 11, 15, 17
No Connection
VCC
14
14
20
Power Pin
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
(1)
MIN
MAX
UNIT
VCC
Supply voltage
–0.5
7
V
VI
Input voltage(2)
–0.5
7
V
VO
Output voltage, VO
(2)
–0.5
VCC + 0.5
V
IIK
Input clamp current
VI < 0
-20
mA
IOK
Output clamp current
VO < 0 or VO > VCC
±20
mA
IO
Continuous output current
VO = 0 to VCC
±25
mA
Continuous current through VCC or GND
±50
mA
TJ
Junction temperature
150
°C
Tstg
Storage temperature
–65
150
°C
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
7.2 ESD Ratings
VALUE
UNIT
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
±2000
Electrostatic
V(ESD)
V
discharge
Charged-device model (CDM), per JEDEC specification JESD22-C101(2)
±1000
(1)
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Manufacturing with
less than 500-V HBM is possible with the necessary precautions.
(2)
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. Manufacturing with
less than 250-V CDM is possible with the necessary precautions.
4
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Copyright © 1996–2015, Texas Instruments Incorporated
Product Folder Links: SN74AHC08 SN54AHC08


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