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SMV512K32HFG Datasheet(PDF) 3 Page - Texas Instruments

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No. de Pieza. SMV512K32HFG
Descripción  16-Mb RADIATION-HARDENED SRAM
Descarga  26 Pages
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Fabricante  TI1 [Texas Instruments]
Página de inicio  http://www.ti.com
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SMV512K32HFG Datasheet(HTML) 3 Page - Texas Instruments

 
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SMV512K32-SP
www.ti.com
SLVSA21I – JUNE 2011 – REVISED JANUARY 2014
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
TERMINAL FUNCTIONS
PIN NAME
TYPE
ACTIVE
DESCRIPTION
A[18:0]
Input
N/A
Address
DQ[31:0]
Bidirectional
N/A
Data input/output
E1Z
Input
Low
Chip enable - 1
E2
Input
High
Chip enable - 2
WZ
Input
Low
Write enable
GZ
Input
Low
Output enable for bidirectional input/output
VDD1
Power
N/A
Power supply (1.8 V)
VDD2
Power
N/A
Power supply (3.3 V)
VSS1
Power
N/A
Ground (core)
VSS2
Power
N/A
Ground (I/O)
Used for setting master/slave selection.
MSS
Input
N/A
Connect to VSS2 for master operation and
VDD2 for slave operation.
Multiple bit or single bit error indicator
MBE
Bidirectional
High
(output - user programmable)
EDAC function select (input)
Master SCRUBZ (output)
SCRUBZ
Bidirectional
Low
Slave SCRUBZ (input)
Master BUSYZ (output)
BUSYZ
Output
Low
Slave (do not use)
ABSOLUTE MAXIMUM RATINGS
Over operating free-air temperature range (unless otherwise noted).
(1)
VALUE
UNIT
VDD1
DC supply voltage(core)
–0.3 to 2.0
V
VDD2
DC supply voltage (I/O)
–0.3 to 3.8
V
VI/O
Voltage on any pin
–0.3 to 3.8
V
TSTG
Storage temperature
–65 to 150
°C
PD
Maximum power dissipation
1.2
W
TJ
Maximum junction temperature
150
°C
θJC
Thermal resistance, junction-to-case
5
°C/W
II
DC input current
±5
mA
(1)
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Copyright © 2011–2014, Texas Instruments Incorporated
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